Fault tolerant methods using dynamically reconfigurable devices have been studied to overcome wear-out failures. However, quantitative comparisons have not been sufficiently assessed on device lifetime enhancement with these methods, whereas they have mainly been evaluated individually from various viewpoints such as additional hardware overheads, performance, and downtime for fault recovery. This paper presents quantitative lifetime evaluations performed by simulating the fault-avoidance procedures of five representative methods under the same conditions in wear-out scenarios, applications, and device architecture. The simulation results indicated that improvements of up to 70% mean-time-to-failure (MTTF) in comparison with ideal fault avoidance could be achieved by using methods of fault avoidance with ‘row direction shift’ and ‘dynamic partial reconfiguration’. ‘Column shift’, on the other hand, attained a high degree of stability with moderate improvements in MTTF. The experimental results also revealed that spare basic elements (BEs) should be prevented from aging so that improvements in MTTF would not be adversely affected. Moreover, we found that the selection of initial mappings guided by wire utilization could increase the lifetimes of partial reconfiguration based fault avoidance.
Hiroaki KONOURA
Osaka University,CREST
Takashi IMAGAWA
Kyoto University,CREST
Yukio MITSUYAMA
Kochi University of Technology,CREST
Masanori HASHIMOTO
Osaka University,CREST
Takao ONOYE
Osaka University,CREST
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Hiroaki KONOURA, Takashi IMAGAWA, Yukio MITSUYAMA, Masanori HASHIMOTO, Takao ONOYE, "Comparative Evaluation of Lifetime Enhancement with Fault Avoidance on Dynamically Reconfigurable Devices" in IEICE TRANSACTIONS on Fundamentals,
vol. E97-A, no. 7, pp. 1468-1482, July 2014, doi: 10.1587/transfun.E97.A.1468.
Abstract: Fault tolerant methods using dynamically reconfigurable devices have been studied to overcome wear-out failures. However, quantitative comparisons have not been sufficiently assessed on device lifetime enhancement with these methods, whereas they have mainly been evaluated individually from various viewpoints such as additional hardware overheads, performance, and downtime for fault recovery. This paper presents quantitative lifetime evaluations performed by simulating the fault-avoidance procedures of five representative methods under the same conditions in wear-out scenarios, applications, and device architecture. The simulation results indicated that improvements of up to 70% mean-time-to-failure (MTTF) in comparison with ideal fault avoidance could be achieved by using methods of fault avoidance with ‘row direction shift’ and ‘dynamic partial reconfiguration’. ‘Column shift’, on the other hand, attained a high degree of stability with moderate improvements in MTTF. The experimental results also revealed that spare basic elements (BEs) should be prevented from aging so that improvements in MTTF would not be adversely affected. Moreover, we found that the selection of initial mappings guided by wire utilization could increase the lifetimes of partial reconfiguration based fault avoidance.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.E97.A.1468/_p
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@ARTICLE{e97-a_7_1468,
author={Hiroaki KONOURA, Takashi IMAGAWA, Yukio MITSUYAMA, Masanori HASHIMOTO, Takao ONOYE, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Comparative Evaluation of Lifetime Enhancement with Fault Avoidance on Dynamically Reconfigurable Devices},
year={2014},
volume={E97-A},
number={7},
pages={1468-1482},
abstract={Fault tolerant methods using dynamically reconfigurable devices have been studied to overcome wear-out failures. However, quantitative comparisons have not been sufficiently assessed on device lifetime enhancement with these methods, whereas they have mainly been evaluated individually from various viewpoints such as additional hardware overheads, performance, and downtime for fault recovery. This paper presents quantitative lifetime evaluations performed by simulating the fault-avoidance procedures of five representative methods under the same conditions in wear-out scenarios, applications, and device architecture. The simulation results indicated that improvements of up to 70% mean-time-to-failure (MTTF) in comparison with ideal fault avoidance could be achieved by using methods of fault avoidance with ‘row direction shift’ and ‘dynamic partial reconfiguration’. ‘Column shift’, on the other hand, attained a high degree of stability with moderate improvements in MTTF. The experimental results also revealed that spare basic elements (BEs) should be prevented from aging so that improvements in MTTF would not be adversely affected. Moreover, we found that the selection of initial mappings guided by wire utilization could increase the lifetimes of partial reconfiguration based fault avoidance.},
keywords={},
doi={10.1587/transfun.E97.A.1468},
ISSN={1745-1337},
month={July},}
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TY - JOUR
TI - Comparative Evaluation of Lifetime Enhancement with Fault Avoidance on Dynamically Reconfigurable Devices
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 1468
EP - 1482
AU - Hiroaki KONOURA
AU - Takashi IMAGAWA
AU - Yukio MITSUYAMA
AU - Masanori HASHIMOTO
AU - Takao ONOYE
PY - 2014
DO - 10.1587/transfun.E97.A.1468
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E97-A
IS - 7
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - July 2014
AB - Fault tolerant methods using dynamically reconfigurable devices have been studied to overcome wear-out failures. However, quantitative comparisons have not been sufficiently assessed on device lifetime enhancement with these methods, whereas they have mainly been evaluated individually from various viewpoints such as additional hardware overheads, performance, and downtime for fault recovery. This paper presents quantitative lifetime evaluations performed by simulating the fault-avoidance procedures of five representative methods under the same conditions in wear-out scenarios, applications, and device architecture. The simulation results indicated that improvements of up to 70% mean-time-to-failure (MTTF) in comparison with ideal fault avoidance could be achieved by using methods of fault avoidance with ‘row direction shift’ and ‘dynamic partial reconfiguration’. ‘Column shift’, on the other hand, attained a high degree of stability with moderate improvements in MTTF. The experimental results also revealed that spare basic elements (BEs) should be prevented from aging so that improvements in MTTF would not be adversely affected. Moreover, we found that the selection of initial mappings guided by wire utilization could increase the lifetimes of partial reconfiguration based fault avoidance.
ER -