IEICE TRANSACTIONS on Information
Post-BIST Fault Diagnosis for Multiple Faults
Summary :
With the increasing complexity of LSI, Built-In Self Test (BIST) is a promising technique for production testing. We herein propose a method for diagnosing multiple stuck-at faults based on the compressed responses from BIST. We refer to fault diagnosis based on the ambiguous test pattern set obtained by the compressed responses of BIST as post-BIST fault diagnosis [1]. In the present paper, we propose an effective method by which to perform post-BIST fault diagnosis for multiple stuck-at faults. The efficiency of the success ratio and the feasibility of diagnosing large circuits are discussed.
- Publication
- IEICE TRANSACTIONS on Information Vol.E91-D No.3 pp.771-775
- Publication Date
- 2008/03/01
- Publicized
- Online ISSN
- 1745-1361
- DOI
- 10.1093/ietisy/e91-d.3.771
- Type of Manuscript
- Special Section LETTER (Special Section on Test and Verification of VLSIs)
- Category
Authors
Keyword
Latest Issue
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Hiroshi TAKAHASHI, Yoshinobu HIGAMI, Shuhei KADOYAMA, Yuzo TAKAMATSU, Koji YAMAZAKI, Takashi AIKYO, Yasuo SATO, "Post-BIST Fault Diagnosis for Multiple Faults" in IEICE TRANSACTIONS on Information,
vol. E91-D, no. 3, pp. 771-775, March 2008, doi: 10.1093/ietisy/e91-d.3.771.
Abstract: With the increasing complexity of LSI, Built-In Self Test (BIST) is a promising technique for production testing. We herein propose a method for diagnosing multiple stuck-at faults based on the compressed responses from BIST. We refer to fault diagnosis based on the ambiguous test pattern set obtained by the compressed responses of BIST as post-BIST fault diagnosis [1]. In the present paper, we propose an effective method by which to perform post-BIST fault diagnosis for multiple stuck-at faults. The efficiency of the success ratio and the feasibility of diagnosing large circuits are discussed.
URL: https://global.ieice.org/en_transactions/information/10.1093/ietisy/e91-d.3.771/_p
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@ARTICLE{e91-d_3_771,
author={Hiroshi TAKAHASHI, Yoshinobu HIGAMI, Shuhei KADOYAMA, Yuzo TAKAMATSU, Koji YAMAZAKI, Takashi AIKYO, Yasuo SATO, },
journal={IEICE TRANSACTIONS on Information},
title={Post-BIST Fault Diagnosis for Multiple Faults},
year={2008},
volume={E91-D},
number={3},
pages={771-775},
abstract={With the increasing complexity of LSI, Built-In Self Test (BIST) is a promising technique for production testing. We herein propose a method for diagnosing multiple stuck-at faults based on the compressed responses from BIST. We refer to fault diagnosis based on the ambiguous test pattern set obtained by the compressed responses of BIST as post-BIST fault diagnosis [1]. In the present paper, we propose an effective method by which to perform post-BIST fault diagnosis for multiple stuck-at faults. The efficiency of the success ratio and the feasibility of diagnosing large circuits are discussed.},
keywords={},
doi={10.1093/ietisy/e91-d.3.771},
ISSN={1745-1361},
month={March},}
Copy
TY - JOUR
TI - Post-BIST Fault Diagnosis for Multiple Faults
T2 - IEICE TRANSACTIONS on Information
SP - 771
EP - 775
AU - Hiroshi TAKAHASHI
AU - Yoshinobu HIGAMI
AU - Shuhei KADOYAMA
AU - Yuzo TAKAMATSU
AU - Koji YAMAZAKI
AU - Takashi AIKYO
AU - Yasuo SATO
PY - 2008
DO - 10.1093/ietisy/e91-d.3.771
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E91-D
IS - 3
JA - IEICE TRANSACTIONS on Information
Y1 - March 2008
AB - With the increasing complexity of LSI, Built-In Self Test (BIST) is a promising technique for production testing. We herein propose a method for diagnosing multiple stuck-at faults based on the compressed responses from BIST. We refer to fault diagnosis based on the ambiguous test pattern set obtained by the compressed responses of BIST as post-BIST fault diagnosis [1]. In the present paper, we propose an effective method by which to perform post-BIST fault diagnosis for multiple stuck-at faults. The efficiency of the success ratio and the feasibility of diagnosing large circuits are discussed.
ER -
English
