In this paper we present a method to generate test sequences for stuck-at faults in sequential circuits which have distinguishing sequences. Since the circuit may have no distinguishing sequence, we use two design techniques for circuits which have distinguishing sequences. One is at state transition level and the other is at gate level. In our proposed method complete test sequence can be generated. The sequence consists of test vectors for the combinational part of the circuit, distinguishing sequences and transition sequences. The test vectors, which are generated by a combinational test generator, cause faulty staes or faulty output responses for a fault, and disinguishing sequences identify the differences between faulty states and fault free states. Transition sequences are necessary to make the state in the combinational vectors. And the distinguishing sequence and the transition sequence are used in the initializing sequence. Some techniques for shortening the test sequence is also proposed. The basic ideas of the techniques are to use a short initializing sequence and to find the order in concatenating sequences. But fault simulation is conducted so as not to miss any faults. The initializing sequence is obtained by using a distinguishing sequence. The efficiency of our method is shown in the experimental results for benchmark circuits.

Small delay caused by a resistive open is difficult to test since circuit delay varies depending on various factors such as process variations and crosstalk even in fault-free circuits. We consider the problem of discriminating a resistive open by anomaly detection using delay distributions obtained by the effect of various input signals provided to adjacent lines. We examined the circuit delay in a fault-free circuit and a faulty circuit by applying electromagnetic simulator and circuit simulator for a line structure with adjacent lines under consideration of process variations. The effectiveness of the method that discriminates a resistive open is shown for the results obtained by the simulation.

In this paper, we propose a test generation method for diagnosing transition faults. The proposed method assumes launch on capture test, and it generates test vectors for given fault pairs using a stuck-at ATPG tool so that they can be distinguished. If a given fault pair is indistinguishable, it is identified, and thus the proposed method achieves a complete diagnostic test generation. The conditions for distinguishing a fault pair are carefully considered, and they are transformed into the conditions of the detection of a stuck-at fault, and some additional logic gates are inserted in a CUT during the test generation process. Experimental results show that the proposed method can generate test vectors for distinguishing the fault pairs that are not distinguished by commercial tools, and also identify indistinguishable fault pairs.

This paper presents a test generation method for sequential circuits under IDDQ testing environment and the identification of untestable faults based on the information of illegal states. We consider a short between two signal lines, a short within one gate and a short between two nodes in different gates. The proposed test generation method consists of two techniques. First technique is to use weighted random vectors, and second technique is to use test generator for stuck-at faults. By using the two techniques together, high fault coverage and short computational time can be achieved. Finally experimental results for ISCAS89 benchmark circuits are presented.

In general, we do not know which fault model can explain the cause of the faulty values at the primary outputs in a circuit under test before starting diagnosis. Moreover, under Built-In Self Test (BIST) environment, it is difficult to know which primary output has a faulty value on the application of a failing test pattern. In this paper, we propose an effective diagnosis method on multiple fault models, based on only pass/fail information on the applied test patterns. The proposed method deduces both the fault model and the fault location based on the number of detections for the single stuck-at fault at each line, by performing single stuck-at fault simulation with both passing and failing test patterns. To improve the ability of fault diagnosis, our method uses the logic values of lines and the condition whether the stuck-at faults at the lines are detected or not by passing and failing test patterns. Experimental results show that our method can accurately identify the fault models (stuck-at fault model, AND/OR bridging fault model, dominance bridging fault model, or open fault model) for 90% faulty circuits and that the faulty sites are located within two candidate faults.

In this paper we propose two diagnosis methods for crosstalk-induced pulse faults in sequential circuits using crosstalk fault simulation. These methods compare observed responses and simulated values at primary outputs to identify a set of suspected faults that are consistent with the observed responses. The first method is a restart-based method which determines the suspected fault list by using the knowledge about the first and last failures of the test sequence. The advantage of the restart-based method over a method using full simulation is its reduction of the number of simulated faults in a process of diagnosing faults. The second method is a resumption-based method which uses stored state information. The advantage of the resumption-based method over the restart-based method is its reduction of the CPU time for diagnosing the faults. The effectiveness of the proposed methods is evaluated by experiments conducted on ISCAS '89 benchmark circuits. From the experimental results we show that the number of suspected faults obtained by our methods is sufficiently small, and the resumption-based method is substantially faster than the restart-based method.

Multi-cycle Test looks promising a way to reduce the test application time of POST (Power-on Self-Test) for achieving a targeted high fault coverage specified by ISO26262 for testing automotive devices. In this paper, we first analyze the mechanism of Stuck-at Fault Detection Degradation problem in multi-cycle test. Based on the result of our analysis we propose a novel solution named FF-Control Point Insertion technique (FF-CPI) to achieve the reduction of scan-in patterns by multi-cycle test. The FF-CPI technique modifies the captured values of scan Flip-Flops (FFs) during capture operation by directly reversing the value of partial FFs or loading random vectors. The FF-CPI technique enhances the number of detectable stuck-at faults under the capture patterns. The experimental results of ISCAS89 and ITC99 benchmarks validated the effectiveness of FF-CPI technique in scan-in pattern reduction for POST.

This paper presents methods for detecting transistor short faults using logic level fault simulation and test generation. The paper considers two types of transistor level faults, namely strong shorts and weak shorts, which were introduced in our previous research. These faults are defined based on the values of outputs of faulty gates. The proposed fault simulation and test generation are performed using gate-level tools designed to deal with stuck-at faults, and no transistor-level tools are required. In the test generation process, a circuit is modified by inserting inverters, and a stuck-at test generator is used. The modification of a circuit does not mean a design-for-testability technique, as the modified circuit is used only during the test generation process. Further, generated test patterns are compacted by fault simulation. Also, since the weak short model involves uncertainty in its behavior, we define fault coverage and fault efficiency in three different way, namely, optimistic, pessimistic and probabilistic and assess them. Finally, experimental results for ISCAS benchmark circuits are used to demonstrate the effectiveness of the proposed methods.

This paper deals with delay faults on clock lines assuming the launch-on-capture test. In this realistic fault model, the amount of delay at the FF driven by the faulty clock line is such that the scan shift operation can perform correctly even in the presence of a fault, but during the system clock operation, capturing functional value(s) at faulty FF(s), i.e. FF(s) driven by the clock with delay, is delayed and correct value(s) may not be captured. We developed a fault simulator that can handle such faults and using this simulator we investigate the relation between the duration of the delay and the difficulty of detecting clock delay faults in the launch-on-capture test. Next, we propose test generation methods for detecting clock delay faults that affect a single or two FFs. Experimental results for benchmark circuits are given in order to establish the effectiveness of the proposed methods.

With the increasing complexity of LSI, Built-In Self Test (BIST) is a promising technique for production testing. We herein propose a method for diagnosing multiple stuck-at faults based on the compressed responses from BIST. We refer to fault diagnosis based on the ambiguous test pattern set obtained by the compressed responses of BIST as post-BIST fault diagnosis [1]. In the present paper, we propose an effective method by which to perform post-BIST fault diagnosis for multiple stuck-at faults. The efficiency of the success ratio and the feasibility of diagnosing large circuits are discussed.

In this paper, the authors propose an integer linear programming (ILP) model for static multi-car elevator operation problems. Here, “static” means that all information which make the behavior of the elevator system indeterministic is known before scheduling. The proposed model is based on the trip-based ILP model for static single-car elevator operation problems. A trip of an elevator is a one-directional movement of that elevator, which is labaled upward or downward. In the trip-based ILP model, an elevator trajectory is scheduled according to decision variables which determine allocations of trips to users of an elevator system. That model has such an advantage that the difficulty in solving ILP formulations resulted by that model does not depend on the length of the planning horizon nor the height of the considered building, thus is effective when elevator trajectories are simple. Moreover, that model has many variables relevant to elevators' positions. The proposed model is resulted by adding 3 constraints which are basically based on those variables and make it possible to prevent elevators in a same shaft from interfering. The first constraint simply imposes the first and last floors of an upper trip to be above those of its lower trip. The second constraint imagines the crossing point between upper and lower trips and imposes it ahead of or behind the lower trip according to their directions. The last constraint estimates future positions of elevators and imposes the upper trip to be above floors of passengers on the lower trip. The basic validity of the proposed model is displayed by solving 90 problem instances and examining elevator trajectories generated from them, then comparing objective function values of elevator trajectories on a multi-car elevator system with those on single-car elevator systems.

In this paper, we propose a method to diagnose a bridging fault between a clock line and a gate signal line. Assuming that scan based flush tests are applied, we perform fault simulation to deduce candidate faults. By analyzing fault behavior, it is revealed that faulty clock waveforms depend on the timing of the signal transition on a gate signal line which is bridged. In the fault simulation, a backward sensitized path tracing approach is introduced to calculate the timing of signal transitions. Experimental results show that the proposed method deduces candidate faults more accurately than our previous method.

Physical defects that are not covered by stuck-at fault or bridging fault model are increasing in LSI circuits designed and manufactured in modern Deep Sub-Micron (DSM) technologies. Therefore, it is necessary to target non-stuck-at and non-bridging faults. A stuck-open is one such fault model that captures transistor level defects. This paper presents two methods for maximizing stuck-open fault coverage using stuck-at test vectors. In this paper we assume that a test set to detect stuck-at faults is given and we consider two formulations for maximizing stuck-open coverage using the given test set as follows. The first problem is to form a test sequence by using each test vector multiple times, if needed, as long as the stuck-open coverage is increased. In this case the target is to make the resultant test sequence as short as possible under the constraint that the maximum stuck-open coverage is achieved using the given test set. The second problem is to form a test sequence by using each test vector exactly once only. Thus in this case the length of the test sequence is maintained as the number of given test vectors. In both formulations the stuck-at fault coverage does not change. The effectiveness of the proposed methods is established by experimental results for benchmark circuits.

In this paper, we aim to develop technologies for the circuit fault diagnosis and propose a formulation of a measure of a test pattern for the circuit fault diagnosis. Given a faulty circuit, the fault diagnosis is to deduce locations of faults that had occurred in the circuit. The fault diagnosis is executed in software before the failure analysis by which engineers inspect physical defects, and helps to improve the manufacturing process which yielded faulty circuits. The heart of the fault diagnosis is to distinguish between candidate faults by using test patterns, which are applied to the circuit-under-diagnosis (CUD), and thus test patterns that can distinguish as many faults as possible need to be generated. This fact motivates us to consider the test pattern measure based on the number of fault-pairs that become distinguished by a test pattern. To the best of the authors' knowledge, that measure requires the computational time of complexity order O(NF2), where NF denotes the number of candidate faults. Since NF is generally large for real industrial circuits, the computational time of the measure is long even when a high-performance computer is used. The formulation proposed in this paper makes it possible to calculate the measure in the computational complexity of O(NF log NF), and thus that measure is useful for the test pattern selection in the fault diagnosis. In computational experiments, the effectiveness of the formulation is demonstrated as samples of computational times of the measure calculated by the traditional and the proposed formulae and thorough comparisons between several greedy heuristics which are based on the measure.

This paper presents a method, called reduced scan shift, which generates short test sequences for full scan circuits. In this method, scan shift operations can be reduced, i.e., not all but part of flip-flops (FFs) are controlled and observed. This method, unlike partial scan methods, does not decrease fault coverage. In the reduced scan shift, test vectors for the combinational part of a circuit are fistly generated. Since short test sequence will be obtained from the small test vectors set, test compaction techniques are used in the test vector generation. For each test vector in the obtained test set, it is found which FFs should be controlled or observed. And then a scan chain is configured so that FFs more frequently required to be controlled (observed) can be located close to the scan input (output). After the scan chain is configured, the scan shift requirement is examined for the essential faults of each test vector. Essential fault is defined to be a fault which is detected by only one test vector but not other test vectors. The order of test vectors is carefully determined by comparing the scan control requirement of a test vector with the scan observation requirement of another test vector so that unnecessary scan shift operations only for controlling or observing FFs can be reduced. A method of determining the order of test vectors with state transition is additionally described. The effectiveness of the proposed method is shown by the experimental results for benchmark circuits.

Recently there are various requirements for LSI testing, such as test compaction, test compression, low power dissipation or increase of defect coverage. If test sequences contain lots of don't cares (Xs), then their flexibility can be used to meet the above requirements. In this paper, we propose methods for finding as many Xs as possible in test sequences for sequential circuits. Given a fully specified test sequence generated by a sequential ATPG, the proposed methods produce a test sequence containing Xs without losing stuck-at fault coverage of the original test sequence. The methods apply an approach based on fault simulation, and they introduce some heuristics for reducing the simulation effort. Experimental results for ISCAS'89 benchmark circuits show the effectiveness of the proposed methods.

Memory-based Programmable Logic Device (MPLD) is a new type of reconfigurable device constructed using a general SRAM array in a unique interconnect configuration. This research aims to propose approaches to guarantee the long-term reliability of MPLDs, including a test method to identify interconnect defects in the SRAM array during the production phase and a delay monitoring technique to detect aging-caused failures. The proposed test method configures pre-generated test configuration data into SRAMs to create fault propagation paths, applies an external walking-zero/one vector to excite faults, and identifies faults at the external output ports. The proposed delay monitoring method configures a novel ring oscillator logic design into MPLD to measure delay variations when the device is in practical use. The logic simulation results with fault injection confirm the effectiveness of the proposed methods.

Shorts and opens are two major kind of defects that are most likely to occur in Very Large Scale Integrated Circuits. In modern Integrated Circuit devices these defects must be considered not only at gate-level but also at transistor level. In this paper, we propose a method for generating test vectors that targets both transistor shorts (tr-shorts) and transistor opens (tr-opens). Since two consecutive test vectors need to be applied in order to detect tr-opens, we assume launch on capture (LOC) test application mechanism. This makes it possible to detect delay type defects. Further, the proposed method employs existing stuck-at test generation tools thus requiring no change in the design and development flow and development of no new tools is needed. Experimental results for benchmark circuits demonstrate the effectiveness of the proposed method by providing 100% fault efficiency while the test set size is still moderate.

When LSIs that are designed and manufactured for low power dissipation are tested, test vectors that make the power dissipation low should be applied. If test vectors that cause high power dissipation are applied, incorrect test results are obtained or circuits under test are permanently damaged. In this paper, we propose a method to generate test sequences with low power dissipation for sequential circuits. We assume test sequences generated by an ATPG tool are given, and modify them while keeping the original stuck-at fault coverages. The test sequence is modified by inverting the values of primary inputs of every test vector one by one. In order to keep the original fault coverage, fault simulation is conducted whenever one value of primary inputs is inverted. We introduce heuristics that perform fault simulation for a subset of faults during the modification of test vectors. This helps reduce the power dissipation of the modified test sequence. If the fault coverage by the modified test sequence is lower than that by the original test sequence, we generate a new short test sequence and add it to the modified test sequence.