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In this paper, we aim to develop technologies for the circuit fault diagnosis and propose a formulation of a measure of a test pattern for the circuit fault diagnosis. Given a faulty circuit, the fault diagnosis is to deduce locations of faults that had occurred in the circuit. The fault diagnosis is executed in software before the failure analysis by which engineers inspect physical defects, and helps to improve the manufacturing process which yielded faulty circuits. The heart of the fault diagnosis is to distinguish between candidate faults by using test patterns, which are applied to the circuit-under-diagnosis (CUD), and thus test patterns that can distinguish as many faults as possible need to be generated. This fact motivates us to consider the test pattern measure based on the number of fault-pairs that become distinguished by a test pattern. To the best of the authors' knowledge, that measure requires the computational time of complexity order *O*(*N*_{F}^{2}), where *N*_{F} denotes the number of candidate faults. Since *N*_{F} is generally large for real industrial circuits, the computational time of the measure is long even when a high-performance computer is used. The formulation proposed in this paper makes it possible to calculate the measure in the computational complexity of *O*(*N*_{F} log *N*_{F}), and thus that measure is useful for the test pattern selection in the fault diagnosis. In computational experiments, the effectiveness of the formulation is demonstrated as samples of computational times of the measure calculated by the traditional and the proposed formulae and thorough comparisons between several greedy heuristics which are based on the measure.

- Publication
- IEICE TRANSACTIONS on Fundamentals Vol.E103-A No.12 pp.1456-1463

- Publication Date
- 2020/12/01

- Publicized

- Online ISSN
- 1745-1337

- DOI
- 10.1587/transfun.2020VLP0007

- Type of Manuscript
- Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)

- Category

Tsutomu INAMOTO

Ehime University

Yoshinobu HIGAMI

Ehime University

The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.

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Tsutomu INAMOTO, Yoshinobu HIGAMI, "Formulation of a Test Pattern Measure That Counts Distinguished Fault-Pairs for Circuit Fault Diagnosis" in IEICE TRANSACTIONS on Fundamentals,
vol. E103-A, no. 12, pp. 1456-1463, December 2020, doi: 10.1587/transfun.2020VLP0007.

Abstract: In this paper, we aim to develop technologies for the circuit fault diagnosis and propose a formulation of a measure of a test pattern for the circuit fault diagnosis. Given a faulty circuit, the fault diagnosis is to deduce locations of faults that had occurred in the circuit. The fault diagnosis is executed in software before the failure analysis by which engineers inspect physical defects, and helps to improve the manufacturing process which yielded faulty circuits. The heart of the fault diagnosis is to distinguish between candidate faults by using test patterns, which are applied to the circuit-under-diagnosis (CUD), and thus test patterns that can distinguish as many faults as possible need to be generated. This fact motivates us to consider the test pattern measure based on the number of fault-pairs that become distinguished by a test pattern. To the best of the authors' knowledge, that measure requires the computational time of complexity order *O*(*N*_{F}^{2}), where *N*_{F} denotes the number of candidate faults. Since *N*_{F} is generally large for real industrial circuits, the computational time of the measure is long even when a high-performance computer is used. The formulation proposed in this paper makes it possible to calculate the measure in the computational complexity of *O*(*N*_{F} log *N*_{F}), and thus that measure is useful for the test pattern selection in the fault diagnosis. In computational experiments, the effectiveness of the formulation is demonstrated as samples of computational times of the measure calculated by the traditional and the proposed formulae and thorough comparisons between several greedy heuristics which are based on the measure.

URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.2020VLP0007/_p

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@ARTICLE{e103-a_12_1456,

author={Tsutomu INAMOTO, Yoshinobu HIGAMI, },

journal={IEICE TRANSACTIONS on Fundamentals},

title={Formulation of a Test Pattern Measure That Counts Distinguished Fault-Pairs for Circuit Fault Diagnosis},

year={2020},

volume={E103-A},

number={12},

pages={1456-1463},

abstract={In this paper, we aim to develop technologies for the circuit fault diagnosis and propose a formulation of a measure of a test pattern for the circuit fault diagnosis. Given a faulty circuit, the fault diagnosis is to deduce locations of faults that had occurred in the circuit. The fault diagnosis is executed in software before the failure analysis by which engineers inspect physical defects, and helps to improve the manufacturing process which yielded faulty circuits. The heart of the fault diagnosis is to distinguish between candidate faults by using test patterns, which are applied to the circuit-under-diagnosis (CUD), and thus test patterns that can distinguish as many faults as possible need to be generated. This fact motivates us to consider the test pattern measure based on the number of fault-pairs that become distinguished by a test pattern. To the best of the authors' knowledge, that measure requires the computational time of complexity order *O*(*N*_{F}^{2}), where *N*_{F} denotes the number of candidate faults. Since *N*_{F} is generally large for real industrial circuits, the computational time of the measure is long even when a high-performance computer is used. The formulation proposed in this paper makes it possible to calculate the measure in the computational complexity of *O*(*N*_{F} log *N*_{F}), and thus that measure is useful for the test pattern selection in the fault diagnosis. In computational experiments, the effectiveness of the formulation is demonstrated as samples of computational times of the measure calculated by the traditional and the proposed formulae and thorough comparisons between several greedy heuristics which are based on the measure.},

keywords={},

doi={10.1587/transfun.2020VLP0007},

ISSN={1745-1337},

month={December},}

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TY - JOUR

TI - Formulation of a Test Pattern Measure That Counts Distinguished Fault-Pairs for Circuit Fault Diagnosis

T2 - IEICE TRANSACTIONS on Fundamentals

SP - 1456

EP - 1463

AU - Tsutomu INAMOTO

AU - Yoshinobu HIGAMI

PY - 2020

DO - 10.1587/transfun.2020VLP0007

JO - IEICE TRANSACTIONS on Fundamentals

SN - 1745-1337

VL - E103-A

IS - 12

JA - IEICE TRANSACTIONS on Fundamentals

Y1 - December 2020

AB - In this paper, we aim to develop technologies for the circuit fault diagnosis and propose a formulation of a measure of a test pattern for the circuit fault diagnosis. Given a faulty circuit, the fault diagnosis is to deduce locations of faults that had occurred in the circuit. The fault diagnosis is executed in software before the failure analysis by which engineers inspect physical defects, and helps to improve the manufacturing process which yielded faulty circuits. The heart of the fault diagnosis is to distinguish between candidate faults by using test patterns, which are applied to the circuit-under-diagnosis (CUD), and thus test patterns that can distinguish as many faults as possible need to be generated. This fact motivates us to consider the test pattern measure based on the number of fault-pairs that become distinguished by a test pattern. To the best of the authors' knowledge, that measure requires the computational time of complexity order *O*(*N*_{F}^{2}), where *N*_{F} denotes the number of candidate faults. Since *N*_{F} is generally large for real industrial circuits, the computational time of the measure is long even when a high-performance computer is used. The formulation proposed in this paper makes it possible to calculate the measure in the computational complexity of *O*(*N*_{F} log *N*_{F}), and thus that measure is useful for the test pattern selection in the fault diagnosis. In computational experiments, the effectiveness of the formulation is demonstrated as samples of computational times of the measure calculated by the traditional and the proposed formulae and thorough comparisons between several greedy heuristics which are based on the measure.

ER -