IEICE TRANSACTIONS on Information
Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG Tool
Summary :
In this paper, we propose a test generation method for diagnosing transition faults. The proposed method assumes launch on capture test, and it generates test vectors for given fault pairs using a stuck-at ATPG tool so that they can be distinguished. If a given fault pair is indistinguishable, it is identified, and thus the proposed method achieves a complete diagnostic test generation. The conditions for distinguishing a fault pair are carefully considered, and they are transformed into the conditions of the detection of a stuck-at fault, and some additional logic gates are inserted in a CUT during the test generation process. Experimental results show that the proposed method can generate test vectors for distinguishing the fault pairs that are not distinguished by commercial tools, and also identify indistinguishable fault pairs.
- Publication
- IEICE TRANSACTIONS on Information Vol.E95-D No.4 pp.1093-1100
- Publication Date
- 2012/04/01
- Publicized
- Online ISSN
- 1745-1361
- DOI
- 10.1587/transinf.E95.D.1093
- Type of Manuscript
- PAPER
- Category
- Dependable Computing
Authors
Keyword
Latest Issue
Copyrights notice of machine-translated contents
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Cite this
Copy
Yoshinobu HIGAMI, Satoshi OHNO, Hironori YAMAOKA, Hiroshi TAKAHASHI, Yoshihiro SHIMIZU, Takashi AIKYO, "Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG Tool" in IEICE TRANSACTIONS on Information,
vol. E95-D, no. 4, pp. 1093-1100, April 2012, doi: 10.1587/transinf.E95.D.1093.
Abstract: In this paper, we propose a test generation method for diagnosing transition faults. The proposed method assumes launch on capture test, and it generates test vectors for given fault pairs using a stuck-at ATPG tool so that they can be distinguished. If a given fault pair is indistinguishable, it is identified, and thus the proposed method achieves a complete diagnostic test generation. The conditions for distinguishing a fault pair are carefully considered, and they are transformed into the conditions of the detection of a stuck-at fault, and some additional logic gates are inserted in a CUT during the test generation process. Experimental results show that the proposed method can generate test vectors for distinguishing the fault pairs that are not distinguished by commercial tools, and also identify indistinguishable fault pairs.
URL: https://global.ieice.org/en_transactions/information/10.1587/transinf.E95.D.1093/_p
Copy
@ARTICLE{e95-d_4_1093,
author={Yoshinobu HIGAMI, Satoshi OHNO, Hironori YAMAOKA, Hiroshi TAKAHASHI, Yoshihiro SHIMIZU, Takashi AIKYO, },
journal={IEICE TRANSACTIONS on Information},
title={Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG Tool},
year={2012},
volume={E95-D},
number={4},
pages={1093-1100},
abstract={In this paper, we propose a test generation method for diagnosing transition faults. The proposed method assumes launch on capture test, and it generates test vectors for given fault pairs using a stuck-at ATPG tool so that they can be distinguished. If a given fault pair is indistinguishable, it is identified, and thus the proposed method achieves a complete diagnostic test generation. The conditions for distinguishing a fault pair are carefully considered, and they are transformed into the conditions of the detection of a stuck-at fault, and some additional logic gates are inserted in a CUT during the test generation process. Experimental results show that the proposed method can generate test vectors for distinguishing the fault pairs that are not distinguished by commercial tools, and also identify indistinguishable fault pairs.},
keywords={},
doi={10.1587/transinf.E95.D.1093},
ISSN={1745-1361},
month={April},}
Copy
TY - JOUR
TI - Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG Tool
T2 - IEICE TRANSACTIONS on Information
SP - 1093
EP - 1100
AU - Yoshinobu HIGAMI
AU - Satoshi OHNO
AU - Hironori YAMAOKA
AU - Hiroshi TAKAHASHI
AU - Yoshihiro SHIMIZU
AU - Takashi AIKYO
PY - 2012
DO - 10.1587/transinf.E95.D.1093
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E95-D
IS - 4
JA - IEICE TRANSACTIONS on Information
Y1 - April 2012
AB - In this paper, we propose a test generation method for diagnosing transition faults. The proposed method assumes launch on capture test, and it generates test vectors for given fault pairs using a stuck-at ATPG tool so that they can be distinguished. If a given fault pair is indistinguishable, it is identified, and thus the proposed method achieves a complete diagnostic test generation. The conditions for distinguishing a fault pair are carefully considered, and they are transformed into the conditions of the detection of a stuck-at fault, and some additional logic gates are inserted in a CUT during the test generation process. Experimental results show that the proposed method can generate test vectors for distinguishing the fault pairs that are not distinguished by commercial tools, and also identify indistinguishable fault pairs.
ER -
English
