IEICE TRANSACTIONS on Information
Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information
Summary :
In general, we do not know which fault model can explain the cause of the faulty values at the primary outputs in a circuit under test before starting diagnosis. Moreover, under Built-In Self Test (BIST) environment, it is difficult to know which primary output has a faulty value on the application of a failing test pattern. In this paper, we propose an effective diagnosis method on multiple fault models, based on only pass/fail information on the applied test patterns. The proposed method deduces both the fault model and the fault location based on the number of detections for the single stuck-at fault at each line, by performing single stuck-at fault simulation with both passing and failing test patterns. To improve the ability of fault diagnosis, our method uses the logic values of lines and the condition whether the stuck-at faults at the lines are detected or not by passing and failing test patterns. Experimental results show that our method can accurately identify the fault models (stuck-at fault model, AND/OR bridging fault model, dominance bridging fault model, or open fault model) for 90% faulty circuits and that the faulty sites are located within two candidate faults.
- Publication
- IEICE TRANSACTIONS on Information Vol.E91-D No.3 pp.675-682
- Publication Date
- 2008/03/01
- Publicized
- Online ISSN
- 1745-1361
- DOI
- 10.1093/ietisy/e91-d.3.675
- Type of Manuscript
- Special Section PAPER (Special Section on Test and Verification of VLSIs)
- Category
- Fault Diagnosis
Authors
Keyword
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Yuzo TAKAMATSU, Hiroshi TAKAHASHI, Yoshinobu HIGAMI, Takashi AIKYO, Koji YAMAZAKI, "Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information" in IEICE TRANSACTIONS on Information,
vol. E91-D, no. 3, pp. 675-682, March 2008, doi: 10.1093/ietisy/e91-d.3.675.
Abstract: In general, we do not know which fault model can explain the cause of the faulty values at the primary outputs in a circuit under test before starting diagnosis. Moreover, under Built-In Self Test (BIST) environment, it is difficult to know which primary output has a faulty value on the application of a failing test pattern. In this paper, we propose an effective diagnosis method on multiple fault models, based on only pass/fail information on the applied test patterns. The proposed method deduces both the fault model and the fault location based on the number of detections for the single stuck-at fault at each line, by performing single stuck-at fault simulation with both passing and failing test patterns. To improve the ability of fault diagnosis, our method uses the logic values of lines and the condition whether the stuck-at faults at the lines are detected or not by passing and failing test patterns. Experimental results show that our method can accurately identify the fault models (stuck-at fault model, AND/OR bridging fault model, dominance bridging fault model, or open fault model) for 90% faulty circuits and that the faulty sites are located within two candidate faults.
URL: https://global.ieice.org/en_transactions/information/10.1093/ietisy/e91-d.3.675/_p
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@ARTICLE{e91-d_3_675,
author={Yuzo TAKAMATSU, Hiroshi TAKAHASHI, Yoshinobu HIGAMI, Takashi AIKYO, Koji YAMAZAKI, },
journal={IEICE TRANSACTIONS on Information},
title={Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information},
year={2008},
volume={E91-D},
number={3},
pages={675-682},
abstract={In general, we do not know which fault model can explain the cause of the faulty values at the primary outputs in a circuit under test before starting diagnosis. Moreover, under Built-In Self Test (BIST) environment, it is difficult to know which primary output has a faulty value on the application of a failing test pattern. In this paper, we propose an effective diagnosis method on multiple fault models, based on only pass/fail information on the applied test patterns. The proposed method deduces both the fault model and the fault location based on the number of detections for the single stuck-at fault at each line, by performing single stuck-at fault simulation with both passing and failing test patterns. To improve the ability of fault diagnosis, our method uses the logic values of lines and the condition whether the stuck-at faults at the lines are detected or not by passing and failing test patterns. Experimental results show that our method can accurately identify the fault models (stuck-at fault model, AND/OR bridging fault model, dominance bridging fault model, or open fault model) for 90% faulty circuits and that the faulty sites are located within two candidate faults.},
keywords={},
doi={10.1093/ietisy/e91-d.3.675},
ISSN={1745-1361},
month={March},}
Copy
TY - JOUR
TI - Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information
T2 - IEICE TRANSACTIONS on Information
SP - 675
EP - 682
AU - Yuzo TAKAMATSU
AU - Hiroshi TAKAHASHI
AU - Yoshinobu HIGAMI
AU - Takashi AIKYO
AU - Koji YAMAZAKI
PY - 2008
DO - 10.1093/ietisy/e91-d.3.675
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E91-D
IS - 3
JA - IEICE TRANSACTIONS on Information
Y1 - March 2008
AB - In general, we do not know which fault model can explain the cause of the faulty values at the primary outputs in a circuit under test before starting diagnosis. Moreover, under Built-In Self Test (BIST) environment, it is difficult to know which primary output has a faulty value on the application of a failing test pattern. In this paper, we propose an effective diagnosis method on multiple fault models, based on only pass/fail information on the applied test patterns. The proposed method deduces both the fault model and the fault location based on the number of detections for the single stuck-at fault at each line, by performing single stuck-at fault simulation with both passing and failing test patterns. To improve the ability of fault diagnosis, our method uses the logic values of lines and the condition whether the stuck-at faults at the lines are detected or not by passing and failing test patterns. Experimental results show that our method can accurately identify the fault models (stuck-at fault model, AND/OR bridging fault model, dominance bridging fault model, or open fault model) for 90% faulty circuits and that the faulty sites are located within two candidate faults.
ER -
English
