IEICE TRANSACTIONS on Fundamentals
Discrimination of a Resistive Open Using Anomaly Detection of Delay Variation Induced by Transitions on Adjacent Lines
Summary :
Small delay caused by a resistive open is difficult to test since circuit delay varies depending on various factors such as process variations and crosstalk even in fault-free circuits. We consider the problem of discriminating a resistive open by anomaly detection using delay distributions obtained by the effect of various input signals provided to adjacent lines. We examined the circuit delay in a fault-free circuit and a faulty circuit by applying electromagnetic simulator and circuit simulator for a line structure with adjacent lines under consideration of process variations. The effectiveness of the method that discriminates a resistive open is shown for the results obtained by the simulation.
- Publication
- IEICE TRANSACTIONS on Fundamentals Vol.E100-A No.12 pp.2842-2850
- Publication Date
- 2017/12/01
- Publicized
- Online ISSN
- 1745-1337
- DOI
- 10.1587/transfun.E100.A.2842
- Type of Manuscript
- Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
- Category
Authors
Hiroyuki YOTSUYANAGI
Tokushima University
Kotaro ISE
Tokushima University
Masaki HASHIZUME
Tokushima University
Yoshinobu HIGAMI
Ehime University
Hiroshi TAKAHASHI
Ehime University
Keyword
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Hiroyuki YOTSUYANAGI, Kotaro ISE, Masaki HASHIZUME, Yoshinobu HIGAMI, Hiroshi TAKAHASHI, "Discrimination of a Resistive Open Using Anomaly Detection of Delay Variation Induced by Transitions on Adjacent Lines" in IEICE TRANSACTIONS on Fundamentals,
vol. E100-A, no. 12, pp. 2842-2850, December 2017, doi: 10.1587/transfun.E100.A.2842.
Abstract: Small delay caused by a resistive open is difficult to test since circuit delay varies depending on various factors such as process variations and crosstalk even in fault-free circuits. We consider the problem of discriminating a resistive open by anomaly detection using delay distributions obtained by the effect of various input signals provided to adjacent lines. We examined the circuit delay in a fault-free circuit and a faulty circuit by applying electromagnetic simulator and circuit simulator for a line structure with adjacent lines under consideration of process variations. The effectiveness of the method that discriminates a resistive open is shown for the results obtained by the simulation.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.E100.A.2842/_p
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@ARTICLE{e100-a_12_2842,
author={Hiroyuki YOTSUYANAGI, Kotaro ISE, Masaki HASHIZUME, Yoshinobu HIGAMI, Hiroshi TAKAHASHI, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Discrimination of a Resistive Open Using Anomaly Detection of Delay Variation Induced by Transitions on Adjacent Lines},
year={2017},
volume={E100-A},
number={12},
pages={2842-2850},
abstract={Small delay caused by a resistive open is difficult to test since circuit delay varies depending on various factors such as process variations and crosstalk even in fault-free circuits. We consider the problem of discriminating a resistive open by anomaly detection using delay distributions obtained by the effect of various input signals provided to adjacent lines. We examined the circuit delay in a fault-free circuit and a faulty circuit by applying electromagnetic simulator and circuit simulator for a line structure with adjacent lines under consideration of process variations. The effectiveness of the method that discriminates a resistive open is shown for the results obtained by the simulation.},
keywords={},
doi={10.1587/transfun.E100.A.2842},
ISSN={1745-1337},
month={December},}
Copy
TY - JOUR
TI - Discrimination of a Resistive Open Using Anomaly Detection of Delay Variation Induced by Transitions on Adjacent Lines
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 2842
EP - 2850
AU - Hiroyuki YOTSUYANAGI
AU - Kotaro ISE
AU - Masaki HASHIZUME
AU - Yoshinobu HIGAMI
AU - Hiroshi TAKAHASHI
PY - 2017
DO - 10.1587/transfun.E100.A.2842
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E100-A
IS - 12
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - December 2017
AB - Small delay caused by a resistive open is difficult to test since circuit delay varies depending on various factors such as process variations and crosstalk even in fault-free circuits. We consider the problem of discriminating a resistive open by anomaly detection using delay distributions obtained by the effect of various input signals provided to adjacent lines. We examined the circuit delay in a fault-free circuit and a faulty circuit by applying electromagnetic simulator and circuit simulator for a line structure with adjacent lines under consideration of process variations. The effectiveness of the method that discriminates a resistive open is shown for the results obtained by the simulation.
ER -
English
