A Method and the Effect of Shuffling Compactor Inputs in VLSI Self-Testing
Summary :
Signature analysis using a Multiple-Input LFSR as the output response compaction circuit is widely adopted in actual BIST schemes. While aliasing probabilities for random errors are usually very small, MI-LFSRs are tend to fail detecting diagonal errors. A spot error, which include the diagonal error as a particular case, is defined as multiple bit crrors adjacent in space and in time domain. Then, shuffling of interconnection between CUT output and MI-LFSR input is studied as a scheme to prevent aliasing for such errors. The condition for preventing aliasing due to a predetermined size of single spot error is shown. Block based shuffling and the shortened one are proposed to realize required distance properties. Effect of shuffling for multiple spot errors is examined by simulation showing that shuffling is effective also for a certain extend of multiple spot errors.
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- IEICE TRANSACTIONS on Information Vol.E75-D No.6 pp.842-846
- Publication Date
- 1992/11/25
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- Special Section PAPER (Special Issue on Pacific Rim International Symposium on Fault Tolerant Systems)
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Kiyoshi FURUYA, Edward J. McCLUSKEY, "A Method and the Effect of Shuffling Compactor Inputs in VLSI Self-Testing" in IEICE TRANSACTIONS on Information,
vol. E75-D, no. 6, pp. 842-846, November 1992, doi: .
Abstract: Signature analysis using a Multiple-Input LFSR as the output response compaction circuit is widely adopted in actual BIST schemes. While aliasing probabilities for random errors are usually very small, MI-LFSRs are tend to fail detecting diagonal errors. A spot error, which include the diagonal error as a particular case, is defined as multiple bit crrors adjacent in space and in time domain. Then, shuffling of interconnection between CUT output and MI-LFSR input is studied as a scheme to prevent aliasing for such errors. The condition for preventing aliasing due to a predetermined size of single spot error is shown. Block based shuffling and the shortened one are proposed to realize required distance properties. Effect of shuffling for multiple spot errors is examined by simulation showing that shuffling is effective also for a certain extend of multiple spot errors.
URL: https://global.ieice.org/en_transactions/information/10.1587/e75-d_6_842/_p
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@ARTICLE{e75-d_6_842,
author={Kiyoshi FURUYA, Edward J. McCLUSKEY, },
journal={IEICE TRANSACTIONS on Information},
title={A Method and the Effect of Shuffling Compactor Inputs in VLSI Self-Testing},
year={1992},
volume={E75-D},
number={6},
pages={842-846},
abstract={Signature analysis using a Multiple-Input LFSR as the output response compaction circuit is widely adopted in actual BIST schemes. While aliasing probabilities for random errors are usually very small, MI-LFSRs are tend to fail detecting diagonal errors. A spot error, which include the diagonal error as a particular case, is defined as multiple bit crrors adjacent in space and in time domain. Then, shuffling of interconnection between CUT output and MI-LFSR input is studied as a scheme to prevent aliasing for such errors. The condition for preventing aliasing due to a predetermined size of single spot error is shown. Block based shuffling and the shortened one are proposed to realize required distance properties. Effect of shuffling for multiple spot errors is examined by simulation showing that shuffling is effective also for a certain extend of multiple spot errors.},
keywords={},
doi={},
ISSN={},
month={November},}
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TY - JOUR
TI - A Method and the Effect of Shuffling Compactor Inputs in VLSI Self-Testing
T2 - IEICE TRANSACTIONS on Information
SP - 842
EP - 846
AU - Kiyoshi FURUYA
AU - Edward J. McCLUSKEY
PY - 1992
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E75-D
IS - 6
JA - IEICE TRANSACTIONS on Information
Y1 - November 1992
AB - Signature analysis using a Multiple-Input LFSR as the output response compaction circuit is widely adopted in actual BIST schemes. While aliasing probabilities for random errors are usually very small, MI-LFSRs are tend to fail detecting diagonal errors. A spot error, which include the diagonal error as a particular case, is defined as multiple bit crrors adjacent in space and in time domain. Then, shuffling of interconnection between CUT output and MI-LFSR input is studied as a scheme to prevent aliasing for such errors. The condition for preventing aliasing due to a predetermined size of single spot error is shown. Block based shuffling and the shortened one are proposed to realize required distance properties. Effect of shuffling for multiple spot errors is examined by simulation showing that shuffling is effective also for a certain extend of multiple spot errors.
ER -
English
