In this paper, we present an efficient method for the fault simulation of the reconvergent fan-out stem. Our method minimizes the fault propagating region by analyzing the topology of the circuit, whose region is smaller than that of Tulip's. The efficiency of our method is illustrated by experimental results for a set of benchmark circuits.
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Sang Seol LEE, Kyu Ho PARK, "An Efficient Fault Simulation Method for Reconvergent Fan-Out Stem" in IEICE TRANSACTIONS on Information,
vol. E76-D, no. 7, pp. 771-775, July 1993, doi: .
Abstract: In this paper, we present an efficient method for the fault simulation of the reconvergent fan-out stem. Our method minimizes the fault propagating region by analyzing the topology of the circuit, whose region is smaller than that of Tulip's. The efficiency of our method is illustrated by experimental results for a set of benchmark circuits.
URL: https://global.ieice.org/en_transactions/information/10.1587/e76-d_7_771/_p
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@ARTICLE{e76-d_7_771,
author={Sang Seol LEE, Kyu Ho PARK, },
journal={IEICE TRANSACTIONS on Information},
title={An Efficient Fault Simulation Method for Reconvergent Fan-Out Stem},
year={1993},
volume={E76-D},
number={7},
pages={771-775},
abstract={In this paper, we present an efficient method for the fault simulation of the reconvergent fan-out stem. Our method minimizes the fault propagating region by analyzing the topology of the circuit, whose region is smaller than that of Tulip's. The efficiency of our method is illustrated by experimental results for a set of benchmark circuits.},
keywords={},
doi={},
ISSN={},
month={July},}
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TY - JOUR
TI - An Efficient Fault Simulation Method for Reconvergent Fan-Out Stem
T2 - IEICE TRANSACTIONS on Information
SP - 771
EP - 775
AU - Sang Seol LEE
AU - Kyu Ho PARK
PY - 1993
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E76-D
IS - 7
JA - IEICE TRANSACTIONS on Information
Y1 - July 1993
AB - In this paper, we present an efficient method for the fault simulation of the reconvergent fan-out stem. Our method minimizes the fault propagating region by analyzing the topology of the circuit, whose region is smaller than that of Tulip's. The efficiency of our method is illustrated by experimental results for a set of benchmark circuits.
ER -