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IEICE TRANSACTIONS on Information

An Efficient Fault Simulation Method for Reconvergent Fan-Out Stem

Sang Seol LEE, Kyu Ho PARK

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Summary :

In this paper, we present an efficient method for the fault simulation of the reconvergent fan-out stem. Our method minimizes the fault propagating region by analyzing the topology of the circuit, whose region is smaller than that of Tulip's. The efficiency of our method is illustrated by experimental results for a set of benchmark circuits.

Publication
IEICE TRANSACTIONS on Information Vol.E76-D No.7 pp.771-775
Publication Date
1993/07/25
Publicized
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DOI
Type of Manuscript
Special Section PAPER (Special Issue on VLSI Testing and Testable Design)
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