Soft error jeopardizes the reliability of semiconductor devices, especially those working at low voltage. In recent years, silicon-on-thin-box (SOTB), which is a FD-SOI device, is drawing attention since it is suitable for ultra-low-voltage operation. This work evaluates the contributions of SRAM, FF and combinational circuit to chip-level soft error rate (SER) based on irradiation test results. For this evaluation, this work performed neutron irradiation test for characterizing single event transient (SET) rate of SOTB and bulk circuits at 0.5 V. Using the SBU and MCU data in SRAMs from previous work, we calculated the MBU rate with/without error correcting code (ECC) and with 1/2/4-col MUX interleaving. Combining FF error rates reported in literature, we estimated chip-level SER and each contribution to chip-level SER for embedded and high-performance processors. For both the processors, without ECC, 95% errors occur at SRAM in both SOTB and bulk chips at 0.5 V and 1.0 V, and the overall chip-level SERs of the assumed SOTB chip at 0.5 V is at least 10 x lower than that of bulk chip. On the other hand, when ECC is applied to SRAM in the SOTB chip, SEUs occurring at FFs are dominant in the high-performance processor while MBUs at SRAMs are not negligible in the bulk embedded chips.

This paper proposes 0-1-A-Ā LUT, a new programmable logic using atom switches, and a delay-optimal mapping algorithm for it. Atom switch is a non-volatile memory device of very small geometry which is fabricated between metal layers of a VLSI, and it can be used as a switch device of very small on-resistance and parasitic capacitance. While considerable area reduction of Look Up Tables (LUTs) used in conventional Field Programmable Gate Arrays (FPGAs) has been achieved by simply replacing each SRAM element with a memory element using a pair of atom switches, our 0-1-A-Ā LUT achieves further area and delay reduction. Unlike the conventional atom-switch-based LUT in which all k input signals are fed to a MUX, one of input signals is fed to the switch array, resulting area reduction due to the reduced number of inputs of the MUX from 2k to 2k-1, as well as delay reduction due to reduced fanout load of the input buffers. Since the fanout of this input buffers depends on the mapped logic function, this paper also proposes technology mapping algorithms to select logic function of fewer number of fanouts of input buffers to achieve further delay reduction. From our experiments, the circuit delay using our k-LUT is 0.94% smaller in the best case compared with using the conventional atom-switch-based k-LUT.

Pseudo Power Gating (Pseudo PG) is one of gate level power reduction methods for combinational circuits by stopping unnecessary input changes of gates. In Pseudo PG, an extra control signal might be added to a gate and other input changes of the gate are deactivated when the control signal takes the controlling value. To improve the power reduction capability, the paper newly introduces dual-stage Pseudo PG with advanced clustering algorithm where up to two extra control signals are added to a gate if effective. The advanced clustering algorithm selects the first control signal to be compatible with the second control signal based on the propagation of controlling condition via a path, with which candidates of controllable gates excluded by the maximum depth constraint can be controlled. Experimental results show that the proposed dual-stage Pseudo PG method has obtained 23.23% average power reduction with 5.28% delay penalty with respect to the original circuits, and has obtained 10.46% more power reduction with 2.75% delay penalty compared with respect to circuits applying the original single-stage Pseudo PG.

With the increasing complexity of LSI, Built-In Self Test (BIST) is a promising technique for production testing. We herein propose a method for diagnosing multiple stuck-at faults based on the compressed responses from BIST. We refer to fault diagnosis based on the ambiguous test pattern set obtained by the compressed responses of BIST as post-BIST fault diagnosis [1]. In the present paper, we propose an effective method by which to perform post-BIST fault diagnosis for multiple stuck-at faults. The efficiency of the success ratio and the feasibility of diagnosing large circuits are discussed.

In general, we do not know which fault model can explain the cause of the faulty values at the primary outputs in a circuit under test before starting diagnosis. Moreover, under Built-In Self Test (BIST) environment, it is difficult to know which primary output has a faulty value on the application of a failing test pattern. In this paper, we propose an effective diagnosis method on multiple fault models, based on only pass/fail information on the applied test patterns. The proposed method deduces both the fault model and the fault location based on the number of detections for the single stuck-at fault at each line, by performing single stuck-at fault simulation with both passing and failing test patterns. To improve the ability of fault diagnosis, our method uses the logic values of lines and the condition whether the stuck-at faults at the lines are detected or not by passing and failing test patterns. Experimental results show that our method can accurately identify the fault models (stuck-at fault model, AND/OR bridging fault model, dominance bridging fault model, or open fault model) for 90% faulty circuits and that the faulty sites are located within two candidate faults.

When a feedback bridging fault occurs in a combinational circuit and it is activated, logical oscillation may occur in the circuit. In this paper, some electrical conditions are proposed to identify whether a feedback bridging fault occurs logical oscillation. Also, it is proposed how to estimate the oscillation frequency. They are based on piece linearlized models and do not require circuit simulation of large size of circuits. They are evaluated by some experiments. In the experiments, all of the feedback bridging faults occurring logical oscillation are identified. Also, oscillation frequencies larger than the ones obtained by SPICE simulation are derived by the proposed estimation method in the experiments. It promises us that the methods will be used for identifying such bridging faults and estimating the oscillation frequencies.

In this paper, we propose an alternative method that does not generate a test for each path delay fault directly to generate tests for path delay faults. The proposed method generates an N-propagation test-pair set by using an Ni-detection test set for single stuck-at faults. The N-propagation test-pair set is a set of vector pairs which contains N distinct vector pairs for every transition faults at a check point. Check points consist of primary inputs and fanout branches in a circuit. We do not target the path delay faults for test generation, instead, the N-propagation test-pair set is generated for the transition (both rising and falling) faults of check points in the circuit. After generating tests, tests are simulated to determine their effectiveness for singly testable path delay faults and robust path delay faults. Results of experiments on the ISCAS'85 benchmark circuits show that the N-propagation test-pair sets obtained by our method are effective in testing path delay faults.

The EB tester line delay fault localization algorithm for combinational circuits is proposed where line delay fault probabilities are utilized to narrow fault candidates down to one efficiently. Probabilities for two main causes of line delay faults, defects of contact/vias along interconnections and crosstalk, are estimated through layout analysis. The algorithm was applied to 8 kinds of ISCAS'85 benchmark circuits to evaluate its performance where the guided probe (GP) diagnosis was used as the reference method. The proposed method can cut the number of probed lines to about 30% in average compared with those for the GP method. The total fault localization time was 31% of the time for the GP method and was 6% less than that of our previous method where the fault list generated in concurrent fault simulation is utilized.

In our previous paper we presented a path-tracing method of multiple gate delay fault diagnosis in combinational circuits. In this paper, we propose an improved method that uses the ambiguous delay model. This delay model makes provision for parameter variations in the manufacturing process of ICs. For the effectiveness of the current method, we propose a timed 8-valued simulation and some new diagnostic rules. Furthermore, we introduce a preparatory process that speeds up diagnosis. Also, at the end of diagnosis, additional information from the results of the preparatory process makes it possible to distinguish between non-existent faults and undiagnosed faults.

A. Chatterjee et al. proposed tests with linearity property for gate delay faults to determine, at a required clock speed, whether a circuit under test is a marginal chip or not. The latest transition time at the primary output is changed linearly with the size of the gate delay fault when the proposed test is applied to the circuit under test. To authors' knowledge, no reports on an algorithmic method for generating tests with linearity property have been presented before. In this paper, we propose a method for generating tests with linearity property for gate delay faults. The proposed method introduces a new extended timed calculus to calculate the size of a given gate delay fault that can be propagated to the primary output. The method has been applied to ISCAS benchmark circuits under the unit delay model.

Testing for delay faults is very important in the verification of the timing behavior of digital circuits. When a circuit which is unable to operate at the desired clock speed is identified, it is necessary to locate the delay fault(s) affecting the circuit in order to remedy the situation. In this paper, we present a path-tracing method of multiple gate delay fault diagnosis in combinational circuits. We first present the basic rules for deducing suspected faults based on the multiple gate delay fault assumption. Next, in order to improve diagnostic resolution, we introduce rules for deducing non-existent faults based on the fault-free responses at the primary outputs. Using these rules, we present the detailed method for diagnosing multiple delay faults based on paths sensitized by test-pairs generated for marginal delays and gate delay faults [7]. Finally, we present results obtained from experiments on the ISCAS '85 benchmark circuits. The experimental results show the effectiveness of our method.

Ordered Binary Decision Diagrams (OBDDs) are graph-based representations of Boolean functions which are widely used because of their good properties. In this paper, we introduce nondeterministic OBDDs (NOBDDs) and their restricted forms, and evaluate their expressive power. In some applications of OBDDs, canonicity, which is one of the good properties of OBDDs, is not necessary. In such cases, we can reduce the required amount of storage by using OBDDs in some non-canonical form. A class of NOBDDs can be used as a non-canonical form of OBDDs. In this paper, we focus on two particular methods which can be regarded as using restricted forms of NOBDDs. Our aim is to show how the size of OBDDs can be reduced in such forms from theoretical point of view. Firstly, we consider a method to solve satisfiability problem of combinational circuits using the structure of circuits as a key to reduce the NOBDD size. We show that the NOBDD size is related to the cutwidth of circuits. Secondly, we analyze methods that use OBDDs to represent Boolean functions as sets of product terms. We show that the class of functions treated feasibly in this representation strictly contains that in OBDDs and contained by that in NOBDDs.

A single bridging fault location technique for CMOS combinational circuits is proposed. In this technique, the cause of an error observed at the primary outputs in deduced using a diagnosis table constructed from the circuit under test and the given tests. The size of a diagnosis table is [the number of gates][the number of tests]2 bits, which is much smaller than that of the fault dictionary. The experimental results show that the number of possible bridging faults is reduced to less than 5 in several seconds, when using the tests to detect single stuck-at faults and considering only the bridging faults between physically adjacent nets.

Some undetectable stuck-at faults called the redundant faults are included in practical combinational circuits. The redundant fault does not affect the functional behavior of the circuit even if it exists. The redundant fault, however, causes undesirable effects to the circuit such as increase of delay time and decrease of testability of the circuit. It is considered that some redundant faults may cause the logical defects in the future. In this paper, firstly, we study the testability of the redundant fault in the combinational circuit by using delay effects. Secondly, we propose a method for generating a test-pair of a redundant fault by using an extended seven-valued calculus, called TGRF (Test-pair Generation for Redundant Fault). TGRF generates a dynamically sensitizable path for the target line which propagates the change in the value on the target line to a primary output. Finally, we show experimental results on the benchmark circuits under the assumptions of the unit delay and the fanout weighted delay models. It shows that test-pairs for some redundant faults are generated theoretically.

This paper presents techniques used in combinational test generation for multiple stuck-at faults using the parallel vector pair analysis. The techniques accelerate a test generation procedure previously proposed and reduce the number of test vectors generated, while higher fault coverage is derived. The first technique proposed in this paper, which is applied at the first phase of test generation, is rules of ordering vector pairs to be analyzed, to derive high fault coverage without repeating the analysis for the same vector pairs. The second one is to generate new vector pairs for undetected faults, instead of random vector pairs. Both techniques are based on the idea that faults close to primary inputs should be detected earlier than close to primary outputs. The third technique proposed here is how to construct vector pairs from one input vector in order to accelerate test generation especially for circuits with many primary inputs and scan flip-flops. Experimental results for bench-mark circuits show the effectiveness of the techniques.

Since the time required for testing logic circuits is proportional to the number of test vectors, the size of test sets as well as test generation time is one of the most important factors to be considered in test generation. The size of test sets becomes an essential issue, especially for scan designed circuits, because of the need to shift a test vector serially into the scan path. In this paper, we propose new methods of generating compact test sets to detect al the irredundant single stuck-at faults in combinational circuits. The proposed algorithms calculate a test function for each fault which corresponds to the set of all test vectors for the fault and generate a compact test set by analyzing the test functions. The analysis is based on finding a test vector which detects the largest number of remaining faults. Since our methods select a test vector among all the test vectors, represented by a test function, for a target fault, smaller test sets can be generated, in general, than that by conventional test set compaction methods. The experimental results show that the size of test sets generated by our method is about one-third as large as that without compaction.

In this paper, a new method of synthesizing multi-level logic circuits directly from binary decision diagrams (BDDs) is proposed. In the simple multiplexer implementation, the depth of the synthesized circuit was always O (n), where n is the number of input variables. The new synthesis method attempts to reduce the depth of circuits. The depth of the synthesized circuits is O (log n log w) where w is the maximum width of given BDDs. The synthesized circuits are 2-rail-input 2-rail-output logic circuits. The circuits have good testability; it is proved that the circuits are robustly path-delay fault testable and also totally self-checking for single stuck-at faults.

In this paper, we present an efficient method for the fault simulation of the reconvergent fan-out stem. Our method minimizes the fault propagating region by analyzing the topology of the circuit, whose region is smaller than that of Tulip's. The efficiency of our method is illustrated by experimental results for a set of benchmark circuits.

We propose a method of diagnosing any logical fault in combinational circuits through a repetition of the single fault-net location procedure with the aid of probing, called SIFLAP-G. The basic idea of the method has been obtained through an observation that a single error generated on a fault-net often propagates to primary outputs under an individual test even though multiple fault-nets exist in the circuit under test. Therefore, candidates for each fault-net are first deduced by the erroneous path tracing under the single fault-net assumption and then the fault-net is found out of those candidates by probing. Probing internal nets is done only for some of the candidates, so that it is possible to greatly decrease the number of nets to be probed. Experimental results show that the number seems nearly proportional to the number of fault-nets (about 35 internal nets per fault-net), but almost independent of the type of faults and the circuit size.

Design of high-speed digital circuits such as adders and multipliers is one of the most important issues to implement high performance VLSI systems. This paper proposes a new multiple-valued code assignment algorithm to implement locally computable combinational circuits for k-ary operations. By the decomposition of a given k-ary operation into unary operations, a code assignment algorithm for k-ary operations is developed. Partition theory usually used in the design of sequential circuits is effectively employed for optimal code assignment. Some examples are shown to demonstrate the usefulness of the proposed algorithm.