An Alternative Test Generation for Path Delay Faults by Using Ni-Detection Test Sets
Summary :
In this paper, we propose an alternative method that does not generate a test for each path delay fault directly to generate tests for path delay faults. The proposed method generates an N-propagation test-pair set by using an Ni-detection test set for single stuck-at faults. The N-propagation test-pair set is a set of vector pairs which contains N distinct vector pairs for every transition faults at a check point. Check points consist of primary inputs and fanout branches in a circuit. We do not target the path delay faults for test generation, instead, the N-propagation test-pair set is generated for the transition (both rising and falling) faults of check points in the circuit. After generating tests, tests are simulated to determine their effectiveness for singly testable path delay faults and robust path delay faults. Results of experiments on the ISCAS'85 benchmark circuits show that the N-propagation test-pair sets obtained by our method are effective in testing path delay faults.
- Publication
- IEICE TRANSACTIONS on Information Vol.E86-D No.12 pp.2650-2658
- Publication Date
- 2003/12/01
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section PAPER (Special Issue on Dependable Computing)
- Category
- Test
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Hiroshi TAKAHASHI, Kewal K. SALUJA, Yuzo TAKAMATSU, "An Alternative Test Generation for Path Delay Faults by Using Ni-Detection Test Sets" in IEICE TRANSACTIONS on Information,
vol. E86-D, no. 12, pp. 2650-2658, December 2003, doi: .
Abstract: In this paper, we propose an alternative method that does not generate a test for each path delay fault directly to generate tests for path delay faults. The proposed method generates an N-propagation test-pair set by using an Ni-detection test set for single stuck-at faults. The N-propagation test-pair set is a set of vector pairs which contains N distinct vector pairs for every transition faults at a check point. Check points consist of primary inputs and fanout branches in a circuit. We do not target the path delay faults for test generation, instead, the N-propagation test-pair set is generated for the transition (both rising and falling) faults of check points in the circuit. After generating tests, tests are simulated to determine their effectiveness for singly testable path delay faults and robust path delay faults. Results of experiments on the ISCAS'85 benchmark circuits show that the N-propagation test-pair sets obtained by our method are effective in testing path delay faults.
URL: https://global.ieice.org/en_transactions/information/10.1587/e86-d_12_2650/_p
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@ARTICLE{e86-d_12_2650,
author={Hiroshi TAKAHASHI, Kewal K. SALUJA, Yuzo TAKAMATSU, },
journal={IEICE TRANSACTIONS on Information},
title={An Alternative Test Generation for Path Delay Faults by Using Ni-Detection Test Sets},
year={2003},
volume={E86-D},
number={12},
pages={2650-2658},
abstract={In this paper, we propose an alternative method that does not generate a test for each path delay fault directly to generate tests for path delay faults. The proposed method generates an N-propagation test-pair set by using an Ni-detection test set for single stuck-at faults. The N-propagation test-pair set is a set of vector pairs which contains N distinct vector pairs for every transition faults at a check point. Check points consist of primary inputs and fanout branches in a circuit. We do not target the path delay faults for test generation, instead, the N-propagation test-pair set is generated for the transition (both rising and falling) faults of check points in the circuit. After generating tests, tests are simulated to determine their effectiveness for singly testable path delay faults and robust path delay faults. Results of experiments on the ISCAS'85 benchmark circuits show that the N-propagation test-pair sets obtained by our method are effective in testing path delay faults.},
keywords={},
doi={},
ISSN={},
month={December},}
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TY - JOUR
TI - An Alternative Test Generation for Path Delay Faults by Using Ni-Detection Test Sets
T2 - IEICE TRANSACTIONS on Information
SP - 2650
EP - 2658
AU - Hiroshi TAKAHASHI
AU - Kewal K. SALUJA
AU - Yuzo TAKAMATSU
PY - 2003
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E86-D
IS - 12
JA - IEICE TRANSACTIONS on Information
Y1 - December 2003
AB - In this paper, we propose an alternative method that does not generate a test for each path delay fault directly to generate tests for path delay faults. The proposed method generates an N-propagation test-pair set by using an Ni-detection test set for single stuck-at faults. The N-propagation test-pair set is a set of vector pairs which contains N distinct vector pairs for every transition faults at a check point. Check points consist of primary inputs and fanout branches in a circuit. We do not target the path delay faults for test generation, instead, the N-propagation test-pair set is generated for the transition (both rising and falling) faults of check points in the circuit. After generating tests, tests are simulated to determine their effectiveness for singly testable path delay faults and robust path delay faults. Results of experiments on the ISCAS'85 benchmark circuits show that the N-propagation test-pair sets obtained by our method are effective in testing path delay faults.
ER -
English
