A Study for Testability of Redundant Faults in Combinational Circuits Using Delay Effects

Xiangqiu YU; Hiroshi TAKAHASHI; Yuzo TAKAMATSU

A Study for Testability of Redundant Faults in Combinational Circuits Using Delay Effects

Xiangqiu YU, Hiroshi TAKAHASHI, Yuzo TAKAMATSU

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Some undetectable stuck-at faults called the redundant faults are included in practical combinational circuits. The redundant fault does not affect the functional behavior of the circuit even if it exists. The redundant fault, however, causes undesirable effects to the circuit such as increase of delay time and decrease of testability of the circuit. It is considered that some redundant faults may cause the logical defects in the future. In this paper, firstly, we study the testability of the redundant fault in the combinational circuit by using delay effects. Secondly, we propose a method for generating a test-pair of a redundant fault by using an extended seven-valued calculus, called TGRF (Test-pair Generation for Redundant Fault). TGRF generates a dynamically sensitizable path for the target line which propagates the change in the value on the target line to a primary output. Finally, we show experimental results on the benchmark circuits under the assumptions of the unit delay and the fanout weighted delay models. It shows that test-pairs for some redundant faults are generated theoretically.

Publication: IEICE TRANSACTIONS on Information Vol.E78-D No.7 pp.822-829

Publication Date: 1995/07/25

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Type of Manuscript: Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems)

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Xiangqiu YU, Hiroshi TAKAHASHI, Yuzo TAKAMATSU, "A Study for Testability of Redundant Faults in Combinational Circuits Using Delay Effects" in IEICE TRANSACTIONS on Information, vol. E78-D, no. 7, pp. 822-829, July 1995, doi: .
Abstract: Some undetectable stuck-at faults called the redundant faults are included in practical combinational circuits. The redundant fault does not affect the functional behavior of the circuit even if it exists. The redundant fault, however, causes undesirable effects to the circuit such as increase of delay time and decrease of testability of the circuit. It is considered that some redundant faults may cause the logical defects in the future. In this paper, firstly, we study the testability of the redundant fault in the combinational circuit by using delay effects. Secondly, we propose a method for generating a test-pair of a redundant fault by using an extended seven-valued calculus, called TGRF (Test-pair Generation for Redundant Fault). TGRF generates a dynamically sensitizable path for the target line which propagates the change in the value on the target line to a primary output. Finally, we show experimental results on the benchmark circuits under the assumptions of the unit delay and the fanout weighted delay models. It shows that test-pairs for some redundant faults are generated theoretically.
URL: https://global.ieice.org/en_transactions/information/10.1587/e78-d_7_822/_p

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@ARTICLE{e78-d_7_822,
author={Xiangqiu YU, Hiroshi TAKAHASHI, Yuzo TAKAMATSU, },
journal={IEICE TRANSACTIONS on Information},
title={A Study for Testability of Redundant Faults in Combinational Circuits Using Delay Effects},
year={1995},
volume={E78-D},
number={7},
pages={822-829},
abstract={Some undetectable stuck-at faults called the redundant faults are included in practical combinational circuits. The redundant fault does not affect the functional behavior of the circuit even if it exists. The redundant fault, however, causes undesirable effects to the circuit such as increase of delay time and decrease of testability of the circuit. It is considered that some redundant faults may cause the logical defects in the future. In this paper, firstly, we study the testability of the redundant fault in the combinational circuit by using delay effects. Secondly, we propose a method for generating a test-pair of a redundant fault by using an extended seven-valued calculus, called TGRF (Test-pair Generation for Redundant Fault). TGRF generates a dynamically sensitizable path for the target line which propagates the change in the value on the target line to a primary output. Finally, we show experimental results on the benchmark circuits under the assumptions of the unit delay and the fanout weighted delay models. It shows that test-pairs for some redundant faults are generated theoretically.},
keywords={},
doi={},
ISSN={},
month={July},}

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TY - JOUR
TI - A Study for Testability of Redundant Faults in Combinational Circuits Using Delay Effects
T2 - IEICE TRANSACTIONS on Information
SP - 822
EP - 829
AU - Xiangqiu YU
AU - Hiroshi TAKAHASHI
AU - Yuzo TAKAMATSU
PY - 1995
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E78-D
IS - 7
JA - IEICE TRANSACTIONS on Information
Y1 - July 1995
AB - Some undetectable stuck-at faults called the redundant faults are included in practical combinational circuits. The redundant fault does not affect the functional behavior of the circuit even if it exists. The redundant fault, however, causes undesirable effects to the circuit such as increase of delay time and decrease of testability of the circuit. It is considered that some redundant faults may cause the logical defects in the future. In this paper, firstly, we study the testability of the redundant fault in the combinational circuit by using delay effects. Secondly, we propose a method for generating a test-pair of a redundant fault by using an extended seven-valued calculus, called TGRF (Test-pair Generation for Redundant Fault). TGRF generates a dynamically sensitizable path for the target line which propagates the change in the value on the target line to a primary output. Finally, we show experimental results on the benchmark circuits under the assumptions of the unit delay and the fanout weighted delay models. It shows that test-pairs for some redundant faults are generated theoretically.
ER -