This paper describes the design and evaluation of fully scannable embedded memory arrays. A memory array, such as a register file, is made scannable by adding a small auxiliary circuit including a counter and multiplexers. Plural memory arrays can be chained into a single scan path along with ordinary flip-flops. Detailed configuration and implementation of the scannable CMOS and bipolar LCML register file macros are discussed. The overhead ratio of the CMOS register file macro with 16-word by 16-bit results in an 8.6% transistor count and a 6.4% die area. The access time overhaead is 7.8% and the set-up time increases by about 50ps. Bipolar LCML register file macros have been applied to gate array LSIs which have successfully achieved average stuck-at fault coverage of 99.2%.

The design of complex VLSI systems relies more and more heavily on scientific computing for numerical simulation and configuration/performance optimization. Especially, computer simulation is becoming a component of VLSI design methodology, for which a variety of computation evolutions have been accomplished for the past two decades. There are many different forms of simulation which are used for verification of VLSI design at various stages of the whole design process. They may be classified into functional or behavioral simulators, register transfer level (RTL) simulators, gate-level logic, or simply logic, simulators, timing simulator, circuit simulators, device simulator, and process simulators. Among these simulation tasks, a series of logic, timing, and circuit simulation is most strongly related to the design stage which deals with logic/electric waveform performance of VLSI circuits. This article surveys the state of the art of VLSI simulation, putting stress mainly on the domain of logic, timing, and circuit simulation, since the reader of the Transactions may be interested exclusively in this field.

A new approach is described for the datapath scheduling of behavioral descriptions containing nested conditional branches of arbitrary structures. This paper first investigates such a complex scheduling mechanism, and formulates an optimal scheduling problem as a 0-1 integer programming problem such that given a prescribed number of control steps, the total cost of functional units can be minimized. In this formulation, each constraint is expressed in the form of a Boolean function, which is set equal to 1 or 0 according as the constraint is satisfied or not, respectively, and a satisfiability problem is defined by the product of the Boolean functions. A procedure is then described, which intends to seek an optimal solution by means of a branch-and-bound method on a binary decision diagram representing the satisfiability problem. Experimental results are also shown, which demonstrate that our approach is of more practical use than the existing methods.

This letter presents an algorithm named SPM which generates test patterns for single stuck-at faults in synchronous sequential circuits based on a product machine traversal method. The new idea presented in this letter is partitioned image computation combined with a mixed breadth-first/depth-first search. Image computation is carried out in partitioned manner by substituting constant logical values to some input variables. This brings about significant reduction in storage requirement during image computation. A test generator based on SPM achieved 100% fault efficiency for the ISCAS'89 benchmark circuits with not more than 32 flip-flops.

This paper presents a method of thread composition in a hardware compiler Bach. Bach synthesizes RT level circuits from a system description written in Bach-C language, where a system is modeled as communicating processes running in parallel. The system description is decomposed into threads, i.e., strings of sequential processes, by grouping processes which are not executed in parallel. The set of threads are then converted into behavioral VHDL models and passed to a behavioral synthesizer. The proposed method attempts to find a thread configuration that maximize resource sharing among processes in the threads. Experiments on two real designs show that the circuit sizes were reduced by 3.7% and 14.7%. We also show the detailed statistics and analysis of the size of the resulting gate level circuits.

This paper presents a new binding algorithm for a retargetable compiler which can deal with diverse architectures of application specific embedded processors. The architectural diversity includes a "non-orthogonal" datapath configuration where all the registers are not equally accessible by all the functional units. Under this assumption, binding becomes a hard task because inadvertent assignment of an operation to a functional unit may rule out possible assignment of other operations due to unreachability among datapath resources. We propose a new BDD-based algorithm to solve this problem. While most of the conventional methods are based on the covering of expression trees obtained by decomposing DFGs, our algorithm works directly on the DFGs so as to avoid infeasible bindings. In the experiments, a feasible binding which satisfies the reachability is found or the deficiency of datapath is detected within a few seconds.

This paper presents a novel way of evaluating architecture of embedded custom DSPs which helps designers optimizing the datapath configuration and the instruction set. Given a datapath structure, it evaluates the performance in terms of the estimated number of steps to execute the target program on the datapath. A concept of "parallel constraint" is newly introduced, which enables evaluation of the impact of instruction format design on the performance without explicity specifying the instruction format. The number of execution steps is estimated by a combination of static analysis and dynamic analysis. It enables fast and precise estimation of actual performance in the early design stage. We have developed an architecture evaluation system based on the presented method and applied it to some actual design of signal processors. We demonstrate the accuracy of estimation and the usefulness of the method through its applications.

We have previously proposed a scannable memory configuration which is useful in testing logic blocks around memory arrays. Although the configuration is supposed to be effective in testing the memory array itself by its frequent read/write access during the scan operation, it has not been theoretically shown what types of faults can be detected. In this paper, from a viewpoint of memory testing, we investigate the testability of the scannable memory configuration and propose a memory array test using the scan path. It is shown that we can detect (1) all stuck-at faults in memory cells, (2) all stuck-at faults in address decoders, (3) all stuck-at faults in read/write logic, (4) static, dynamic and 2-coupling faults between memory cells of adjacent words, and (5) static coupling faults between memory cells in the same word. The test can be accomplished simply by comparing scan-in data and scan-out data. The test vector is 20ms bit long, where m is the number of words of the memory array under test and s is the total scan path length.

This paper presents a new fast fault simulation algorithm using a content addressable memory, which deals with zero-delay fault simulation of gate-level synchronous sequential circuits. The computation time of fault simulation for a single vector under the single stuck-at fault model is O(n2) for all the existing fault simulation algorithms on a sequential computers. The new algorithm attempts to reduce the computation time by processing many faults at a time by utilizing a property that a content addressable memory can be regarded as an SIMD type parallel computation machine. According to theoretical estimation, the speed performance of a simulator based on the proposed algorithm is equivalent to a fast fault simulator implemented on a vector supercomputer for a circuit of about 2400 gates.

In this paper, a new method of synthesizing multi-level logic circuits directly from binary decision diagrams (BDDs) is proposed. In the simple multiplexer implementation, the depth of the synthesized circuit was always O (n), where n is the number of input variables. The new synthesis method attempts to reduce the depth of circuits. The depth of the synthesized circuits is O (log n log w) where w is the maximum width of given BDDs. The synthesized circuits are 2-rail-input 2-rail-output logic circuits. The circuits have good testability; it is proved that the circuits are robustly path-delay fault testable and also totally self-checking for single stuck-at faults.

This paper presents implicit representation of binary decision diagrams (implicit BDDs) as a new effecient data structure for Boolean functions. A well-known method of representing graphs by binary decision diagrams (BDDs) is applied to BDDs themselves. Namely, it is a BDD representation of BDDs. Regularity in the structure of BDDs representing certain Boolean functions contributes to significant reduction in size of the resulting implicit BDD repersentation. Since the implicit BDDs also provide canonical forms for Boolean functions, the equivalence of the two implicit BDD forms is decided in time proportional to the representation size. We also show an algorithm to maniqulate Boolean functions on this implicit data structure.

This letter presents a novel framework in high-level synthesis where hardware modules synthesized from functions in a given ANSI-C program can call the other software functions in the program. This enables high-level synthesis from C programs that contains calls to hard-to-synthesize functions, such as dynamic memory management, I/O request, or very large and complex functions. A single-thread implementation scheme is shown, whose correctness has been verified through register transfer level simulation.

In this paper we propose a new timing verification technique named coded time-symbolic simulation, CTSS. Our interest is on simulation of logic circuits consisting of gates whose delay is specified only by its minimum and maximum values. Conventional logic simulation based on min/max delay model leads to over-pessimistic results. In our new method, the cases of possible delay values of each gate are encoded by binary vectors. The circuit behavior for all the possible combinations of the delay values are simulated based on symbolic simulation by assigning Boolean variables to the binary vectors. This simulation technique can deal with logic circuits containing feedback loops as well as combinational circuits. We implemented an efficient simulator by using shared binary decision diagrams (SBDD's) as internal representation of Boolean functions. We also propose novel techniques of analyzing the results of CTSS.

This letter presents a test suite CF3 designed to find bugs in arithmetic optimizers of C compilers. It consists of 13,720 test programs containing all the expression patterns covering all the permutations of 3 operators from 14 operators. CF3 detected more than 70 errors in GCC 4.2-4.5 within 2 hours.

This letter presents a method which attempts to minimize the number of spill codes to resolve usage conflicts of distributed registers in application specific DSPs. It searches for a set of ordering restrictions among operations which sequentialize the lifetimes of the values residing in the same register as much as possible. Experimental results show that the proposed analysis method reduces the number of register spills into 28%.

Since the time required for testing logic circuits is proportional to the number of test vectors, the size of test sets as well as test generation time is one of the most important factors to be considered in test generation. The size of test sets becomes an essential issue, especially for scan designed circuits, because of the need to shift a test vector serially into the scan path. In this paper, we propose new methods of generating compact test sets to detect al the irredundant single stuck-at faults in combinational circuits. The proposed algorithms calculate a test function for each fault which corresponds to the set of all test vectors for the fault and generate a compact test set by analyzing the test functions. The analysis is based on finding a test vector which detects the largest number of remaining faults. Since our methods select a test vector among all the test vectors, represented by a test function, for a target fault, smaller test sets can be generated, in general, than that by conventional test set compaction methods. The experimental results show that the size of test sets generated by our method is about one-third as large as that without compaction.