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[Author] Hiroyuki KANBARA(7hit)

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  • High-Level Synthesis of Software Function Calls

    Masanari NISHIMURA  Nagisa ISHIURA  Yoshiyuki ISHIMORI  Hiroyuki KANBARA  Hiroyuki TOMIYAMA  

     
    LETTER-High-Level Synthesis and System-Level Design

      Vol:
    E91-A No:12
      Page(s):
    3556-3558

    This letter presents a novel framework in high-level synthesis where hardware modules synthesized from functions in a given ANSI-C program can call the other software functions in the program. This enables high-level synthesis from C programs that contains calls to hard-to-synthesize functions, such as dynamic memory management, I/O request, or very large and complex functions. A single-thread implementation scheme is shown, whose correctness has been verified through register transfer level simulation.

  • Language and Compiler for Optimizing Datapath Widths of Embedded Systems

    Akihiko INOUE  Hiroyuki TOMIYAMA  Takanori OKUMA  Hiroyuki KANBARA  Hiroto YASUURA  

     
    PAPER-Co-design

      Vol:
    E81-A No:12
      Page(s):
    2595-2604

    The datapath width of a core processor has a strong effect on cost, power consumption, and performance of an embedded system integrated with memories into a single-chip. However, it is difficult for designers to appropriately determine the datapath width for each application because of the limited reusability of software and the lack of compilation techniques. The purpose of this paper is to clarify supports required from software for the optimal datapath width determination. As a solution, an embedded programming language, called Valen-C, and a retargetable Valen-C compiler are proposed. In this paper, the syntax and semantics of Valen-C along with the mechanism of the Valen-C retargetable compiler and how to preserve the accuracy of computation of programs in relation to various datapath widths are also described. Experiments with practical applications show that the total cost of the system including a core processor, ROM, and RAM is drastically reduced with little performance loss by reducing the datapath width.

  • Reliability-Configurable Mixed-Grained Reconfigurable Array Supporting C-Based Design and Its Irradiation Testing

    Hiroaki KONOURA  Dawood ALNAJJAR  Yukio MITSUYAMA  Hajime SHIMADA  Kazutoshi KOBAYASHI  Hiroyuki KANBARA  Hiroyuki OCHI  Takashi IMAGAWA  Kazutoshi WAKABAYASHI  Masanori HASHIMOTO  Takao ONOYE  Hidetoshi ONODERA  

     
    PAPER-High-Level Synthesis and System-Level Design

      Vol:
    E97-A No:12
      Page(s):
    2518-2529

    This paper proposes a mixed-grained reconfigurable architecture consisting of fine-grained and coarse-grained fabrics, each of which can be configured for different levels of reliability depending on the reliability requirement of target applications, e.g. mission-critical applications to consumer products. Thanks to the fine-grained fabrics, the architecture can accommodate a state machine, which is indispensable for exploiting C-based behavioral synthesis to trade latency with resource usage through multi-step processing using dynamic reconfiguration. In implementing the architecture, the strategy of dynamic reconfiguration, the assignment of configuration storage and the number of implementable states are key factors that determine the achievable trade-off between used silicon area and latency. We thus split the configuration bits into two classes; state-wise configuration bits and state-invariant configuration bits for minimizing area overhead of configuration bit storage. Through a case study, we experimentally explore the appropriate number of implementable states. A proof-of-concept VLSI chip was fabricated in 65nm process. Measurement results show that applications on the chip can be working in a harsh radiation environment. Irradiation tests also show the correlation between the number of sensitive bits and the mean time to failure. Furthermore, the temporal error rate of an example application due to soft errors in the datapath was measured and demonstrated for reliability-aware mapping.

  • Conformance Test of a Logic Synthesis System to the Standard HDL UDL/I

    Satoshi YOKOTA  Hiroyuki KANBARA  

     
    PAPER

      Vol:
    E78-A No:12
      Page(s):
    1742-1748

    This paper presents testing methods for a logic synthesis system which supports the standard HDL UDL/I, focusing on conformance test to the language specification. Conformance test, to prove that the system completely satisfies the language specification, is very important to provide a unified design environment for users of CAD tools which support the language. The basic idea of our testing methods is using a logic simulator, due to a limited schedule for the test execution. We classified the test into two: unit test and integration test. Unit test is a test of each individual functionality of the system, and integration test is a test to prove that the whole system works correctly and satisfies the language specification. And we prepared and used various kinds of test data. One of them is the UDL/I Test Suite and it was also utilized to observe progress of language coverage by the system during the test execution.

  • Module Generation of a CMOS Op Amp Using a Non-linear Optimization Method

    Hidetoshi ONODERA  Hiroyuki KANBARA  Keikichi TAMARU  

     
    LETTER-Integrated Circuit

      Vol:
    E71-E No:10
      Page(s):
    947-949

    An efficient module generator for a micro-power CMOS op amp has been developed. Given a set of performance specifications, the generator optimizes the circuit performance using a non-linear optimization method and produces the corresponding layout.

  • Validation of UDL/I Test Suites and UDL/I Simulation/Synthesis Environment

    Hiroyuki KANBARA  Satoshi YOKOTA  

     
    PAPER

      Vol:
    E78-A No:12
      Page(s):
    1749-1754

    UDL/I test suites and UDL/I Simulation/Synthesis Environment had been developed separately in parallel. Both were designed from syntax and semantics definition of UDL/I Language Reference Manual. Through test of the UDL/I Simulation/Synthesis Environment using the UDL/I test suites, quality of the test suites and the environment had been improved. Finally all the testing result matched with expected one. It was validated that both the test suites and the environment followed UDL/I language specification.

  • VHDL, Verilog-HDL, and UDL/I-Feature Description and Analysis

    P. N. SANKARSHANAN  Hideaki KOBAYASHI  Pankaj KUKKAL  Hiroyuki KANBARA  

     
    PAPER-Hardware Design Languages

      Vol:
    E76-D No:9
      Page(s):
    1055-1065

    This paper presents a description and an analysis of three standard" hardware description languages (HDLs): Very High Speed Integrated Circuit HDL (VHDL), Verilog-HDL, and Unified Design Language for Integrated Circuits (UDL/I), Kyoto University Education Chip (KUE-Chip) is used as a design benchmark to compare the features and syntax of VHDL, Verilog-HDL, and UDL/I.