This paper describes the design and evaluation of fully scannable embedded memory arrays. A memory array, such as a register file, is made scannable by adding a small auxiliary circuit including a counter and multiplexers. Plural memory arrays can be chained into a single scan path along with ordinary flip-flops. Detailed configuration and implementation of the scannable CMOS and bipolar LCML register file macros are discussed. The overhead ratio of the CMOS register file macro with 16-word by 16-bit results in an 8.6% transistor count and a 6.4% die area. The access time overhaead is 7.8% and the set-up time increases by about 50ps. Bipolar LCML register file macros have been applied to gate array LSIs which have successfully achieved average stuck-at fault coverage of 99.2%.

We have previously proposed a scannable memory configuration which is useful in testing logic blocks around memory arrays. Although the configuration is supposed to be effective in testing the memory array itself by its frequent read/write access during the scan operation, it has not been theoretically shown what types of faults can be detected. In this paper, from a viewpoint of memory testing, we investigate the testability of the scannable memory configuration and propose a memory array test using the scan path. It is shown that we can detect (1) all stuck-at faults in memory cells, (2) all stuck-at faults in address decoders, (3) all stuck-at faults in read/write logic, (4) static, dynamic and 2-coupling faults between memory cells of adjacent words, and (5) static coupling faults between memory cells in the same word. The test can be accomplished simply by comparing scan-in data and scan-out data. The test vector is 20ms bit long, where m is the number of words of the memory array under test and s is the total scan path length.