An approach for parallel processing of test-pattern generation for combinational circuits is described. In general, difficulty in test-pattern generation lies in two points; how to deal with a large number of faults, and what to do with faults that are hard to generate their test patterns. These problems can be resolved in a parallel-processing environment on a variable number of processors. Test-pattern generation is shown to be a good application of parallel processing techniques. The proposed method has been implemented on a multi-microcomputer system called LINKS-1 in order to estimate its performance. The results show that the proposed parallel processing method can get a high parallelism and achieve a high degree of acceleration of test-pattern generation.

This paper presents a system-level bus architecture validation technique and shows its application to a consumer product design. This technique enables the entire system to be validated with bus cycle accuracy using bus architecture level models derived from their corresponding behavioral level models. Experimental results from a digital still camera (DSC) system design show that our approach offers much faster simulation speed than register transfer level (RTL) simulators. Using this fast and accurate validation technique, bus architecture designs, validations and optimizations can be effectively carried out at system-level and total turn around time of system designs can be reduced dramatically.

An approach to design for testability using register-transfer level (RTL) partial scan selection is described. We define an RTL circuit model which enables efficient description in an electronic system design automation (ESDA) tool and testability analysis which leads to effective partial scan selection for RTL design including data path circuits and control circuits such as state machines. We also introduced a method of partial scan selection at RTL which selects critical registers and state machines based on RTL testability analysis. DFT techniques using gate level testability measures have been studied and concluded that they are not successful in achieving high fault coverage [15]. However, we started this work for the following reasons, 1) In sequential ATPG procedure, more than two memory elements belonging to a functional units such as registers and state machines are often required to be justified at a time. At RTL, state machines and registers are explicitly described and recognized as functional units while gate level memory elements are scattered over the circuit. 2) As discussed in [6], if the circuit is modified so that the test sequence which causes state transition between initial and final states of sequential ATPG can be easily obtained, ATPG results can be also improved. Complex state machines can be identified at RTL. According to the experimental results, our gate level DFT achieves high fault coverage comparable with the previously published most successful DFT methods, and DFT at RTL resulted in higher fault coverage than gate level DFT at much shorter CPU time.

This letter presents an algorithm named SPM which generates test patterns for single stuck-at faults in synchronous sequential circuits based on a product machine traversal method. The new idea presented in this letter is partitioned image computation combined with a mixed breadth-first/depth-first search. Image computation is carried out in partitioned manner by substituting constant logical values to some input variables. This brings about significant reduction in storage requirement during image computation. A test generator based on SPM achieved 100% fault efficiency for the ISCAS'89 benchmark circuits with not more than 32 flip-flops.

We present a scheme for mixed-mode fault simulation which generates several simulation-models of one circuit and carries out simulation for each. Fault insertion and simulation-model generation is done automatically. Switch-level simulation which utilizes look-up tables is as fast as gate-level simulation. Experimental results show that using behavioral description and switch-level truth tables is effective to improve simulation speed.