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IEICE TRANSACTIONS on Fundamentals

Linear Time Fault Simulation Algorithm Using a Content Addressable Memory

Nagisa ISHIURA, Shuzo YAJIMA

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Summary :

This paper presents a new fast fault simulation algorithm using a content addressable memory, which deals with zero-delay fault simulation of gate-level synchronous sequential circuits. The computation time of fault simulation for a single vector under the single stuck-at fault model is O(n2) for all the existing fault simulation algorithms on a sequential computers. The new algorithm attempts to reduce the computation time by processing many faults at a time by utilizing a property that a content addressable memory can be regarded as an SIMD type parallel computation machine. According to theoretical estimation, the speed performance of a simulator based on the proposed algorithm is equivalent to a fast fault simulator implemented on a vector supercomputer for a circuit of about 2400 gates.

Publication
IEICE TRANSACTIONS on Fundamentals Vol.E75-A No.3 pp.314-320
Publication Date
1992/03/25
Publicized
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DOI
Type of Manuscript
Special Section INVITED PAPER (Special Section on the 4th Karuizawa Workshop on Circuits and Systems)
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