Minimum Test Set for Locally Exhaustive Testing of Multiple Output Combinational Circuits

Hiroyuki MICHINISHI; Tokumi YOKOHIRA; Takuji OKAMOTO

Minimum Test Set for Locally Exhaustive Testing of Multiple Output Combinational Circuits

Hiroyuki MICHINISHI, Tokumi YOKOHIRA, Takuji OKAMOTO

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The locally exhaustive testing of multiple output combinational circuits is the test which provides exhaustive test patterns for each set of inputs on which each output depends. First, this paper presents a sufficient condition under which a minimum test set (MLTS) for the locally exhaustive testing has 2^w test patterns, where w is the maximum number of inputs on which any output depends. Next, we clarify that any CUT with up to four outputs satisfies the condition, independently of w and n, where n is the number of inputs of the CUT. Finally, we clarify that any CUT with five outputs also satisfies the condition for 1w2 or n2wn.

Publication: IEICE TRANSACTIONS on Information Vol.E76-D No.7 pp.791-799

Publication Date: 1993/07/25

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Type of Manuscript: Special Section PAPER (Special Issue on VLSI Testing and Testable Design)

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Hiroyuki MICHINISHI, Tokumi YOKOHIRA, Takuji OKAMOTO, "Minimum Test Set for Locally Exhaustive Testing of Multiple Output Combinational Circuits" in IEICE TRANSACTIONS on Information, vol. E76-D, no. 7, pp. 791-799, July 1993, doi: .
Abstract: The locally exhaustive testing of multiple output combinational circuits is the test which provides exhaustive test patterns for each set of inputs on which each output depends. First, this paper presents a sufficient condition under which a minimum test set (MLTS) for the locally exhaustive testing has 2^w test patterns, where w is the maximum number of inputs on which any output depends. Next, we clarify that any CUT with up to four outputs satisfies the condition, independently of w and n, where n is the number of inputs of the CUT. Finally, we clarify that any CUT with five outputs also satisfies the condition for 1w2 or n2wn.
URL: https://global.ieice.org/en_transactions/information/10.1587/e76-d_7_791/_p

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@ARTICLE{e76-d_7_791,
author={Hiroyuki MICHINISHI, Tokumi YOKOHIRA, Takuji OKAMOTO, },
journal={IEICE TRANSACTIONS on Information},
title={Minimum Test Set for Locally Exhaustive Testing of Multiple Output Combinational Circuits},
year={1993},
volume={E76-D},
number={7},
pages={791-799},
abstract={The locally exhaustive testing of multiple output combinational circuits is the test which provides exhaustive test patterns for each set of inputs on which each output depends. First, this paper presents a sufficient condition under which a minimum test set (MLTS) for the locally exhaustive testing has 2^w test patterns, where w is the maximum number of inputs on which any output depends. Next, we clarify that any CUT with up to four outputs satisfies the condition, independently of w and n, where n is the number of inputs of the CUT. Finally, we clarify that any CUT with five outputs also satisfies the condition for 1w2 or n2wn.},
keywords={},
doi={},
ISSN={},
month={July},}

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TY - JOUR
TI - Minimum Test Set for Locally Exhaustive Testing of Multiple Output Combinational Circuits
T2 - IEICE TRANSACTIONS on Information
SP - 791
EP - 799
AU - Hiroyuki MICHINISHI
AU - Tokumi YOKOHIRA
AU - Takuji OKAMOTO
PY - 1993
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E76-D
IS - 7
JA - IEICE TRANSACTIONS on Information
Y1 - July 1993
AB - The locally exhaustive testing of multiple output combinational circuits is the test which provides exhaustive test patterns for each set of inputs on which each output depends. First, this paper presents a sufficient condition under which a minimum test set (MLTS) for the locally exhaustive testing has 2^w test patterns, where w is the maximum number of inputs on which any output depends. Next, we clarify that any CUT with up to four outputs satisfies the condition, independently of w and n, where n is the number of inputs of the CUT. Finally, we clarify that any CUT with five outputs also satisfies the condition for 1w2 or n2wn.
ER -