IEICE TRANSACTIONS on Information
CMOS Open Defect Detection by Supply Current Measurement under Time-Variable Electric Field Supply
Summary :
In this paper, a new test method is proposed for detecting open defects in CMOS logic ICs. The method is based on supply current of ICs generated by supplying time-variable supply voltage and electric field from the outside of the ICs. Also, test input vectors for the test method are proposed and it is shown that they can be generated more easily than functional test methods based on stuck-at fault models. The feasibility of the test is examined by some experiments. The empirical results promise us that by using the method, open defects in CMOS ICs can be detected.
- Publication
- IEICE TRANSACTIONS on Information Vol.E85-D No.10 pp.1542-1550
- Publication Date
- 2002/10/01
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section PAPER (Special Issue on Test and Verification of VLSI)
- Category
- Current Test
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Masaki HASHIZUME, Masahiro ICHIMIYA, Hiroyuki YOTSUYANAGI, Takeomi TAMESADA, "CMOS Open Defect Detection by Supply Current Measurement under Time-Variable Electric Field Supply" in IEICE TRANSACTIONS on Information,
vol. E85-D, no. 10, pp. 1542-1550, October 2002, doi: .
Abstract: In this paper, a new test method is proposed for detecting open defects in CMOS logic ICs. The method is based on supply current of ICs generated by supplying time-variable supply voltage and electric field from the outside of the ICs. Also, test input vectors for the test method are proposed and it is shown that they can be generated more easily than functional test methods based on stuck-at fault models. The feasibility of the test is examined by some experiments. The empirical results promise us that by using the method, open defects in CMOS ICs can be detected.
URL: https://global.ieice.org/en_transactions/information/10.1587/e85-d_10_1542/_p
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@ARTICLE{e85-d_10_1542,
author={Masaki HASHIZUME, Masahiro ICHIMIYA, Hiroyuki YOTSUYANAGI, Takeomi TAMESADA, },
journal={IEICE TRANSACTIONS on Information},
title={CMOS Open Defect Detection by Supply Current Measurement under Time-Variable Electric Field Supply},
year={2002},
volume={E85-D},
number={10},
pages={1542-1550},
abstract={In this paper, a new test method is proposed for detecting open defects in CMOS logic ICs. The method is based on supply current of ICs generated by supplying time-variable supply voltage and electric field from the outside of the ICs. Also, test input vectors for the test method are proposed and it is shown that they can be generated more easily than functional test methods based on stuck-at fault models. The feasibility of the test is examined by some experiments. The empirical results promise us that by using the method, open defects in CMOS ICs can be detected.},
keywords={},
doi={},
ISSN={},
month={October},}
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TY - JOUR
TI - CMOS Open Defect Detection by Supply Current Measurement under Time-Variable Electric Field Supply
T2 - IEICE TRANSACTIONS on Information
SP - 1542
EP - 1550
AU - Masaki HASHIZUME
AU - Masahiro ICHIMIYA
AU - Hiroyuki YOTSUYANAGI
AU - Takeomi TAMESADA
PY - 2002
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E85-D
IS - 10
JA - IEICE TRANSACTIONS on Information
Y1 - October 2002
AB - In this paper, a new test method is proposed for detecting open defects in CMOS logic ICs. The method is based on supply current of ICs generated by supplying time-variable supply voltage and electric field from the outside of the ICs. Also, test input vectors for the test method are proposed and it is shown that they can be generated more easily than functional test methods based on stuck-at fault models. The feasibility of the test is examined by some experiments. The empirical results promise us that by using the method, open defects in CMOS ICs can be detected.
ER -
English
