IEICE TRANSACTIONS on Information
Analysis and Testing of Analog and Mixed-Signal Circuits by an Operation-Region Model
Summary :
This paper proposes an operation-region model for analyzing and testing analog and mixed-signal circuits, which is based on observation of change in MOSFET operation regions. First, the relation between the change in MOSFET operation regions and the fault behavior of a mixed-signal circuit containing a bridging fault is investigated. Next, we propose an analysis procedure based on the operation-region model and apply it to generate the optimal input combination for testing the circuit. We also determine which transistors should be observed in order to estimate the circuit behavior. Since the operation-region model is a method for modeling circuit behavior abstractly, the proposed method will be useful for modeling circuit behavior and for analyzing and testing many kinds of analog and mixed-signal circuits.
- Publication
- IEICE TRANSACTIONS on Information Vol.E85-D No.10 pp.1551-1557
- Publication Date
- 2002/10/01
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section PAPER (Special Issue on Test and Verification of VLSI)
- Category
- Analog/Mixed Signal Test
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Yukiya MIURA, "Analysis and Testing of Analog and Mixed-Signal Circuits by an Operation-Region Model" in IEICE TRANSACTIONS on Information,
vol. E85-D, no. 10, pp. 1551-1557, October 2002, doi: .
Abstract: This paper proposes an operation-region model for analyzing and testing analog and mixed-signal circuits, which is based on observation of change in MOSFET operation regions. First, the relation between the change in MOSFET operation regions and the fault behavior of a mixed-signal circuit containing a bridging fault is investigated. Next, we propose an analysis procedure based on the operation-region model and apply it to generate the optimal input combination for testing the circuit. We also determine which transistors should be observed in order to estimate the circuit behavior. Since the operation-region model is a method for modeling circuit behavior abstractly, the proposed method will be useful for modeling circuit behavior and for analyzing and testing many kinds of analog and mixed-signal circuits.
URL: https://global.ieice.org/en_transactions/information/10.1587/e85-d_10_1551/_p
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@ARTICLE{e85-d_10_1551,
author={Yukiya MIURA, },
journal={IEICE TRANSACTIONS on Information},
title={Analysis and Testing of Analog and Mixed-Signal Circuits by an Operation-Region Model},
year={2002},
volume={E85-D},
number={10},
pages={1551-1557},
abstract={This paper proposes an operation-region model for analyzing and testing analog and mixed-signal circuits, which is based on observation of change in MOSFET operation regions. First, the relation between the change in MOSFET operation regions and the fault behavior of a mixed-signal circuit containing a bridging fault is investigated. Next, we propose an analysis procedure based on the operation-region model and apply it to generate the optimal input combination for testing the circuit. We also determine which transistors should be observed in order to estimate the circuit behavior. Since the operation-region model is a method for modeling circuit behavior abstractly, the proposed method will be useful for modeling circuit behavior and for analyzing and testing many kinds of analog and mixed-signal circuits.},
keywords={},
doi={},
ISSN={},
month={October},}
Copy
TY - JOUR
TI - Analysis and Testing of Analog and Mixed-Signal Circuits by an Operation-Region Model
T2 - IEICE TRANSACTIONS on Information
SP - 1551
EP - 1557
AU - Yukiya MIURA
PY - 2002
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E85-D
IS - 10
JA - IEICE TRANSACTIONS on Information
Y1 - October 2002
AB - This paper proposes an operation-region model for analyzing and testing analog and mixed-signal circuits, which is based on observation of change in MOSFET operation regions. First, the relation between the change in MOSFET operation regions and the fault behavior of a mixed-signal circuit containing a bridging fault is investigated. Next, we propose an analysis procedure based on the operation-region model and apply it to generate the optimal input combination for testing the circuit. We also determine which transistors should be observed in order to estimate the circuit behavior. Since the operation-region model is a method for modeling circuit behavior abstractly, the proposed method will be useful for modeling circuit behavior and for analyzing and testing many kinds of analog and mixed-signal circuits.
ER -
English
