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This paper proposes an operation-region model for analyzing and testing analog and mixed-signal circuits, which is based on observation of change in MOSFET operation regions. First, the relation between the change in MOSFET operation regions and the fault behavior of a mixed-signal circuit containing a bridging fault is investigated. Next, we propose an analysis procedure based on the operation-region model and apply it to generate the optimal input combination for testing the circuit. We also determine which transistors should be observed in order to estimate the circuit behavior. Since the operation-region model is a method for modeling circuit behavior abstractly, the proposed method will be useful for modeling circuit behavior and for analyzing and testing many kinds of analog and mixed-signal circuits.

- Publication
- IEICE TRANSACTIONS on Information Vol.E85-D No.10 pp.1551-1557

- Publication Date
- 2002/10/01

- Publicized

- Online ISSN

- DOI

- Type of Manuscript
- Special Section PAPER (Special Issue on Test and Verification of VLSI)

- Category
- Analog/Mixed Signal Test

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Yukiya MIURA, "Analysis and Testing of Analog and Mixed-Signal Circuits by an Operation-Region Model" in IEICE TRANSACTIONS on Information,
vol. E85-D, no. 10, pp. 1551-1557, October 2002, doi: .

Abstract: This paper proposes an operation-region model for analyzing and testing analog and mixed-signal circuits, which is based on observation of change in MOSFET operation regions. First, the relation between the change in MOSFET operation regions and the fault behavior of a mixed-signal circuit containing a bridging fault is investigated. Next, we propose an analysis procedure based on the operation-region model and apply it to generate the optimal input combination for testing the circuit. We also determine which transistors should be observed in order to estimate the circuit behavior. Since the operation-region model is a method for modeling circuit behavior abstractly, the proposed method will be useful for modeling circuit behavior and for analyzing and testing many kinds of analog and mixed-signal circuits.

URL: https://global.ieice.org/en_transactions/information/10.1587/e85-d_10_1551/_p

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@ARTICLE{e85-d_10_1551,

author={Yukiya MIURA, },

journal={IEICE TRANSACTIONS on Information},

title={Analysis and Testing of Analog and Mixed-Signal Circuits by an Operation-Region Model},

year={2002},

volume={E85-D},

number={10},

pages={1551-1557},

abstract={This paper proposes an operation-region model for analyzing and testing analog and mixed-signal circuits, which is based on observation of change in MOSFET operation regions. First, the relation between the change in MOSFET operation regions and the fault behavior of a mixed-signal circuit containing a bridging fault is investigated. Next, we propose an analysis procedure based on the operation-region model and apply it to generate the optimal input combination for testing the circuit. We also determine which transistors should be observed in order to estimate the circuit behavior. Since the operation-region model is a method for modeling circuit behavior abstractly, the proposed method will be useful for modeling circuit behavior and for analyzing and testing many kinds of analog and mixed-signal circuits.},

keywords={},

doi={},

ISSN={},

month={October},}

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TY - JOUR

TI - Analysis and Testing of Analog and Mixed-Signal Circuits by an Operation-Region Model

T2 - IEICE TRANSACTIONS on Information

SP - 1551

EP - 1557

AU - Yukiya MIURA

PY - 2002

DO -

JO - IEICE TRANSACTIONS on Information

SN -

VL - E85-D

IS - 10

JA - IEICE TRANSACTIONS on Information

Y1 - October 2002

AB - This paper proposes an operation-region model for analyzing and testing analog and mixed-signal circuits, which is based on observation of change in MOSFET operation regions. First, the relation between the change in MOSFET operation regions and the fault behavior of a mixed-signal circuit containing a bridging fault is investigated. Next, we propose an analysis procedure based on the operation-region model and apply it to generate the optimal input combination for testing the circuit. We also determine which transistors should be observed in order to estimate the circuit behavior. Since the operation-region model is a method for modeling circuit behavior abstractly, the proposed method will be useful for modeling circuit behavior and for analyzing and testing many kinds of analog and mixed-signal circuits.

ER -