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Framework of Timed Trace Theoretic Verification Revisited

Bin ZHOU, Tomohiro YONEDA, Chris MYERS

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Summary :

This paper develops a framework to support trace theoretic verification of timed circuits and systems. A theoretical foundation for classifying timed traces as either successes or failures is developed. The concept of the semimirror is introduced to allow conformance checking thus supporting hierarchical verification of timed circuits and systems. Finally, we relate our framework to those previously proposed for timing verification.

Publication
IEICE TRANSACTIONS on Information Vol.E85-D No.10 pp.1595-1604
Publication Date
2002/10/01
Publicized
Online ISSN
DOI
Type of Manuscript
Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category
Verification

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