Analysis and Testing of Bridging Faults in CMOS Synchronous Sequential Circuits
Summary :
In this paper, we analyze behaviors of bridging faults in CMOS synchronous sequential circuits based on transient analysis. From analysis results, we expose dynamic and analog behaviors of the circuit caused by the bridging faults, which are oscillation, asynchronous sequential behavior, IDDT failure and IDDQ failure as well as logic error. In order to detect this kind of fault, we show that not only IDDQ testing but also IDDT testing and logic testing which guarantees correct state transitions are required.
- Publication
- IEICE TRANSACTIONS on Information Vol.E87-D No.3 pp.564-570
- Publication Date
- 2004/03/01
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section PAPER (Special Section on Test and Verification of VLSI)
- Category
- Fault Detection
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Keyword
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Yukiya MIURA, "Analysis and Testing of Bridging Faults in CMOS Synchronous Sequential Circuits" in IEICE TRANSACTIONS on Information,
vol. E87-D, no. 3, pp. 564-570, March 2004, doi: .
Abstract: In this paper, we analyze behaviors of bridging faults in CMOS synchronous sequential circuits based on transient analysis. From analysis results, we expose dynamic and analog behaviors of the circuit caused by the bridging faults, which are oscillation, asynchronous sequential behavior, IDDT failure and IDDQ failure as well as logic error. In order to detect this kind of fault, we show that not only IDDQ testing but also IDDT testing and logic testing which guarantees correct state transitions are required.
URL: https://global.ieice.org/en_transactions/information/10.1587/e87-d_3_564/_p
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@ARTICLE{e87-d_3_564,
author={Yukiya MIURA, },
journal={IEICE TRANSACTIONS on Information},
title={Analysis and Testing of Bridging Faults in CMOS Synchronous Sequential Circuits},
year={2004},
volume={E87-D},
number={3},
pages={564-570},
abstract={In this paper, we analyze behaviors of bridging faults in CMOS synchronous sequential circuits based on transient analysis. From analysis results, we expose dynamic and analog behaviors of the circuit caused by the bridging faults, which are oscillation, asynchronous sequential behavior, IDDT failure and IDDQ failure as well as logic error. In order to detect this kind of fault, we show that not only IDDQ testing but also IDDT testing and logic testing which guarantees correct state transitions are required.},
keywords={},
doi={},
ISSN={},
month={March},}
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TY - JOUR
TI - Analysis and Testing of Bridging Faults in CMOS Synchronous Sequential Circuits
T2 - IEICE TRANSACTIONS on Information
SP - 564
EP - 570
AU - Yukiya MIURA
PY - 2004
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E87-D
IS - 3
JA - IEICE TRANSACTIONS on Information
Y1 - March 2004
AB - In this paper, we analyze behaviors of bridging faults in CMOS synchronous sequential circuits based on transient analysis. From analysis results, we expose dynamic and analog behaviors of the circuit caused by the bridging faults, which are oscillation, asynchronous sequential behavior, IDDT failure and IDDQ failure as well as logic error. In order to detect this kind of fault, we show that not only IDDQ testing but also IDDT testing and logic testing which guarantees correct state transitions are required.
ER -
English
