Diagnosing Binary Content Addressable Memories with Comparison and RAM Faults
Summary :
Most of system-on-chips (SOCs) have many memory cores. Diagnosis is often used to improve the yield of memories. Memory cores usually represent a significant portion of the chip area and dominate the yield of the chip. Memory diagnosis thus is one of key techniques for improving the yield and quality of SOCs. Content addressable memories (CAMs) are important components in many SOCs. In this paper we propose a three-phase diagnosis procedure for binary CAMs (BCAMs). The user can distinguish different types of BCAM-specific comparison and RAM faults and locate the faulty cells with the procedure. A March-like fault identification algorithm is also proposed. The algorithm can distinguish different types of faults--including typical RAM faults and BCAM-specific comparison faults. The algorithm requires 15N Read/Write operations and 2(N + B) Compare operations for an N
- Publication
- IEICE TRANSACTIONS on Information Vol.E87-D No.3 pp.601-608
- Publication Date
- 2004/03/01
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section PAPER (Special Section on Test and Verification of VLSI)
- Category
- Memory Testing
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Jin-Fu LI, "Diagnosing Binary Content Addressable Memories with Comparison and RAM Faults" in IEICE TRANSACTIONS on Information,
vol. E87-D, no. 3, pp. 601-608, March 2004, doi: .
Abstract: Most of system-on-chips (SOCs) have many memory cores. Diagnosis is often used to improve the yield of memories. Memory cores usually represent a significant portion of the chip area and dominate the yield of the chip. Memory diagnosis thus is one of key techniques for improving the yield and quality of SOCs. Content addressable memories (CAMs) are important components in many SOCs. In this paper we propose a three-phase diagnosis procedure for binary CAMs (BCAMs). The user can distinguish different types of BCAM-specific comparison and RAM faults and locate the faulty cells with the procedure. A March-like fault identification algorithm is also proposed. The algorithm can distinguish different types of faults--including typical RAM faults and BCAM-specific comparison faults. The algorithm requires 15N Read/Write operations and 2(N + B) Compare operations for an N
URL: https://global.ieice.org/en_transactions/information/10.1587/e87-d_3_601/_p
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@ARTICLE{e87-d_3_601,
author={Jin-Fu LI, },
journal={IEICE TRANSACTIONS on Information},
title={Diagnosing Binary Content Addressable Memories with Comparison and RAM Faults},
year={2004},
volume={E87-D},
number={3},
pages={601-608},
abstract={Most of system-on-chips (SOCs) have many memory cores. Diagnosis is often used to improve the yield of memories. Memory cores usually represent a significant portion of the chip area and dominate the yield of the chip. Memory diagnosis thus is one of key techniques for improving the yield and quality of SOCs. Content addressable memories (CAMs) are important components in many SOCs. In this paper we propose a three-phase diagnosis procedure for binary CAMs (BCAMs). The user can distinguish different types of BCAM-specific comparison and RAM faults and locate the faulty cells with the procedure. A March-like fault identification algorithm is also proposed. The algorithm can distinguish different types of faults--including typical RAM faults and BCAM-specific comparison faults. The algorithm requires 15N Read/Write operations and 2(N + B) Compare operations for an N
keywords={},
doi={},
ISSN={},
month={March},}
Copy
TY - JOUR
TI - Diagnosing Binary Content Addressable Memories with Comparison and RAM Faults
T2 - IEICE TRANSACTIONS on Information
SP - 601
EP - 608
AU - Jin-Fu LI
PY - 2004
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E87-D
IS - 3
JA - IEICE TRANSACTIONS on Information
Y1 - March 2004
AB - Most of system-on-chips (SOCs) have many memory cores. Diagnosis is often used to improve the yield of memories. Memory cores usually represent a significant portion of the chip area and dominate the yield of the chip. Memory diagnosis thus is one of key techniques for improving the yield and quality of SOCs. Content addressable memories (CAMs) are important components in many SOCs. In this paper we propose a three-phase diagnosis procedure for binary CAMs (BCAMs). The user can distinguish different types of BCAM-specific comparison and RAM faults and locate the faulty cells with the procedure. A March-like fault identification algorithm is also proposed. The algorithm can distinguish different types of faults--including typical RAM faults and BCAM-specific comparison faults. The algorithm requires 15N Read/Write operations and 2(N + B) Compare operations for an N
ER -
English
