IEICE TRANSACTIONS on Information
Reliability-Enhanced ECC-Based Memory Architecture Using In-Field Self-Repair
Summary :
Embedded memory is extensively being used in SoCs, and is rapidly growing in size and density. It contributes to SoCs to have greater features, but at the expense of taking up the most area. Due to continuous scaling of nanoscale device technology, large area size memory introduces aging-induced faults and soft errors, which affects reliability. In-field test and repair, as well as ECC, can be used to maintain reliability, and recently, these methods are used together to form a combined approach, wherein uncorrectable words are repaired, while correctable words are left to the ECC. In this paper, we propose a novel in-field repair strategy that repairs uncorrectable words, and possibly correctable words, for an ECC-based memory architecture. It executes an adaptive reconfiguration method that ensures 'fresh' memory words are always used until spare words run out. Experimental results demonstrate that our strategy enhances reliability, and the area overhead contribution is small.
- Publication
- IEICE TRANSACTIONS on Information Vol.E99-D No.10 pp.2591-2599
- Publication Date
- 2016/10/01
- Publicized
- 2016/06/27
- Online ISSN
- 1745-1361
- DOI
- 10.1587/transinf.2015EDP7408
- Type of Manuscript
- PAPER
- Category
- Dependable Computing
Authors
Gian MAYUGA
Nara Institute of Science and Technology
Yuta YAMATO
Nara Institute of Science and Technology
Tomokazu YONEDA
Nara Institute of Science and Technology
Yasuo SATO
Kyushu Institute of Technology
Michiko INOUE
Nara Institute of Science and Technology
Keyword
Latest Issue
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Gian MAYUGA, Yuta YAMATO, Tomokazu YONEDA, Yasuo SATO, Michiko INOUE, "Reliability-Enhanced ECC-Based Memory Architecture Using In-Field Self-Repair" in IEICE TRANSACTIONS on Information,
vol. E99-D, no. 10, pp. 2591-2599, October 2016, doi: 10.1587/transinf.2015EDP7408.
Abstract: Embedded memory is extensively being used in SoCs, and is rapidly growing in size and density. It contributes to SoCs to have greater features, but at the expense of taking up the most area. Due to continuous scaling of nanoscale device technology, large area size memory introduces aging-induced faults and soft errors, which affects reliability. In-field test and repair, as well as ECC, can be used to maintain reliability, and recently, these methods are used together to form a combined approach, wherein uncorrectable words are repaired, while correctable words are left to the ECC. In this paper, we propose a novel in-field repair strategy that repairs uncorrectable words, and possibly correctable words, for an ECC-based memory architecture. It executes an adaptive reconfiguration method that ensures 'fresh' memory words are always used until spare words run out. Experimental results demonstrate that our strategy enhances reliability, and the area overhead contribution is small.
URL: https://global.ieice.org/en_transactions/information/10.1587/transinf.2015EDP7408/_p
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@ARTICLE{e99-d_10_2591,
author={Gian MAYUGA, Yuta YAMATO, Tomokazu YONEDA, Yasuo SATO, Michiko INOUE, },
journal={IEICE TRANSACTIONS on Information},
title={Reliability-Enhanced ECC-Based Memory Architecture Using In-Field Self-Repair},
year={2016},
volume={E99-D},
number={10},
pages={2591-2599},
abstract={Embedded memory is extensively being used in SoCs, and is rapidly growing in size and density. It contributes to SoCs to have greater features, but at the expense of taking up the most area. Due to continuous scaling of nanoscale device technology, large area size memory introduces aging-induced faults and soft errors, which affects reliability. In-field test and repair, as well as ECC, can be used to maintain reliability, and recently, these methods are used together to form a combined approach, wherein uncorrectable words are repaired, while correctable words are left to the ECC. In this paper, we propose a novel in-field repair strategy that repairs uncorrectable words, and possibly correctable words, for an ECC-based memory architecture. It executes an adaptive reconfiguration method that ensures 'fresh' memory words are always used until spare words run out. Experimental results demonstrate that our strategy enhances reliability, and the area overhead contribution is small.},
keywords={},
doi={10.1587/transinf.2015EDP7408},
ISSN={1745-1361},
month={October},}
Copy
TY - JOUR
TI - Reliability-Enhanced ECC-Based Memory Architecture Using In-Field Self-Repair
T2 - IEICE TRANSACTIONS on Information
SP - 2591
EP - 2599
AU - Gian MAYUGA
AU - Yuta YAMATO
AU - Tomokazu YONEDA
AU - Yasuo SATO
AU - Michiko INOUE
PY - 2016
DO - 10.1587/transinf.2015EDP7408
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E99-D
IS - 10
JA - IEICE TRANSACTIONS on Information
Y1 - October 2016
AB - Embedded memory is extensively being used in SoCs, and is rapidly growing in size and density. It contributes to SoCs to have greater features, but at the expense of taking up the most area. Due to continuous scaling of nanoscale device technology, large area size memory introduces aging-induced faults and soft errors, which affects reliability. In-field test and repair, as well as ECC, can be used to maintain reliability, and recently, these methods are used together to form a combined approach, wherein uncorrectable words are repaired, while correctable words are left to the ECC. In this paper, we propose a novel in-field repair strategy that repairs uncorrectable words, and possibly correctable words, for an ECC-based memory architecture. It executes an adaptive reconfiguration method that ensures 'fresh' memory words are always used until spare words run out. Experimental results demonstrate that our strategy enhances reliability, and the area overhead contribution is small.
ER -
English
