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Partial Label Metric Learning Based on Statistical Inference

Tian XIE, Hongchang CHEN, Tuosiyu MING, Jianpeng ZHANG, Chao GAO, Shaomei LI, Yuehang DING

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Summary :

In partial label data, the ground-truth label of a training example is concealed in a set of candidate labels associated with the instance. As the ground-truth label is inaccessible, it is difficult to train the classifier via the label information. Consequently, manifold structure information is adopted, which is under the assumption that neighbor/similar instances in the feature space have similar labels in the label space. However, the real-world data may not fully satisfy this assumption. In this paper, a partial label metric learning method based on likelihood-ratio test is proposed to make partial label data satisfy the manifold assumption. Moreover, the proposed method needs no objective function and treats the data pairs asymmetrically. The experimental results on several real-world PLL datasets indicate that the proposed method outperforms the existing partial label metric learning methods in terms of classification accuracy and disambiguation accuracy while costs less time.

Publication
IEICE TRANSACTIONS on Information Vol.E103-D No.6 pp.1355-1361
Publication Date
2020/06/01
Publicized
2020/03/05
Online ISSN
1745-1361
DOI
10.1587/transinf.2019EDP7182
Type of Manuscript
PAPER
Category
Artificial Intelligence, Data Mining

Authors

Tian XIE
  Information Engineering University
Hongchang CHEN
  China National Digital Switching System Engineering & Technological R&D Center
Tuosiyu MING
  China National Digital Switching System Engineering & Technological R&D Center
Jianpeng ZHANG
  China National Digital Switching System Engineering & Technological R&D Center
Chao GAO
  China National Digital Switching System Engineering & Technological R&D Center
Shaomei LI
  China National Digital Switching System Engineering & Technological R&D Center
Yuehang DING
  China National Digital Switching System Engineering & Technological R&D Center

Keyword