This paper describes a simple means to enable direct diagnosis by bypassing MISRs on a small set of tests (MISR-bypass test mode) while achieving ultimate output compression using MISRs for the majority of tests (MISR-enabled test mode.) By combining two compression schemes, XOR and MISRs in the same device, it becomes possible to have high compression and still support compression mode volume diagnostics. In our experiment, the MISR-bypass test was first executed and at 10% of the total test set the MISR-enabled test was performed. The results show that compared with MISR+XOR-based compression the proposed technique provides better volume diagnosis with slightly small (0.71 X to 0.97 X) compaction ratio. The scan cycles are about the same as the MISR-enabled mode. A possible application to partial good chips is also shown.
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Copy
Anis UZZAMAN, Brion KELLER, Brian FOUTZ, Sandeep BHATIA, Thomas BARTENSTEIN, Masayuki ARAI, Kazuhiko IWASAKI, "Reduction of Test Data Volume and Improvement of Diagnosability Using Hybrid Compression" in IEICE TRANSACTIONS on Information,
vol. E93-D, no. 1, pp. 17-23, January 2010, doi: 10.1587/transinf.E93.D.17.
Abstract: This paper describes a simple means to enable direct diagnosis by bypassing MISRs on a small set of tests (MISR-bypass test mode) while achieving ultimate output compression using MISRs for the majority of tests (MISR-enabled test mode.) By combining two compression schemes, XOR and MISRs in the same device, it becomes possible to have high compression and still support compression mode volume diagnostics. In our experiment, the MISR-bypass test was first executed and at 10% of the total test set the MISR-enabled test was performed. The results show that compared with MISR+XOR-based compression the proposed technique provides better volume diagnosis with slightly small (0.71 X to 0.97 X) compaction ratio. The scan cycles are about the same as the MISR-enabled mode. A possible application to partial good chips is also shown.
URL: https://global.ieice.org/en_transactions/information/10.1587/transinf.E93.D.17/_p
Copy
@ARTICLE{e93-d_1_17,
author={Anis UZZAMAN, Brion KELLER, Brian FOUTZ, Sandeep BHATIA, Thomas BARTENSTEIN, Masayuki ARAI, Kazuhiko IWASAKI, },
journal={IEICE TRANSACTIONS on Information},
title={Reduction of Test Data Volume and Improvement of Diagnosability Using Hybrid Compression},
year={2010},
volume={E93-D},
number={1},
pages={17-23},
abstract={This paper describes a simple means to enable direct diagnosis by bypassing MISRs on a small set of tests (MISR-bypass test mode) while achieving ultimate output compression using MISRs for the majority of tests (MISR-enabled test mode.) By combining two compression schemes, XOR and MISRs in the same device, it becomes possible to have high compression and still support compression mode volume diagnostics. In our experiment, the MISR-bypass test was first executed and at 10% of the total test set the MISR-enabled test was performed. The results show that compared with MISR+XOR-based compression the proposed technique provides better volume diagnosis with slightly small (0.71 X to 0.97 X) compaction ratio. The scan cycles are about the same as the MISR-enabled mode. A possible application to partial good chips is also shown.},
keywords={},
doi={10.1587/transinf.E93.D.17},
ISSN={1745-1361},
month={January},}
Copy
TY - JOUR
TI - Reduction of Test Data Volume and Improvement of Diagnosability Using Hybrid Compression
T2 - IEICE TRANSACTIONS on Information
SP - 17
EP - 23
AU - Anis UZZAMAN
AU - Brion KELLER
AU - Brian FOUTZ
AU - Sandeep BHATIA
AU - Thomas BARTENSTEIN
AU - Masayuki ARAI
AU - Kazuhiko IWASAKI
PY - 2010
DO - 10.1587/transinf.E93.D.17
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E93-D
IS - 1
JA - IEICE TRANSACTIONS on Information
Y1 - January 2010
AB - This paper describes a simple means to enable direct diagnosis by bypassing MISRs on a small set of tests (MISR-bypass test mode) while achieving ultimate output compression using MISRs for the majority of tests (MISR-enabled test mode.) By combining two compression schemes, XOR and MISRs in the same device, it becomes possible to have high compression and still support compression mode volume diagnostics. In our experiment, the MISR-bypass test was first executed and at 10% of the total test set the MISR-enabled test was performed. The results show that compared with MISR+XOR-based compression the proposed technique provides better volume diagnosis with slightly small (0.71 X to 0.97 X) compaction ratio. The scan cycles are about the same as the MISR-enabled mode. A possible application to partial good chips is also shown.
ER -