A Practical Threshold Test Generation for Error Tolerant Application
Summary :
Threshold testing, which is an LSI testing method based on the acceptability of faults, is effective in yield enhancement of LSIs and selective hardening for LSI systems. In this paper, we propose test generation models for threshold test generation. Using the proposed models, we can efficiently identify acceptable faults and generate test patterns for unacceptable faults with a general test generation algorithm, i.e., without a test generation algorithm specialized for threshold testing. Experimental results show that our approach is, in practice, effective.
- Publication
- IEICE TRANSACTIONS on Information Vol.E93-D No.10 pp.2776-2782
- Publication Date
- 2010/10/01
- Publicized
- Online ISSN
- 1745-1361
- DOI
- 10.1587/transinf.E93.D.2776
- Type of Manuscript
- PAPER
- Category
- Information Network
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Hideyuki ICHIHARA, Kenta SUTOH, Yuki YOSHIKAWA, Tomoo INOUE, "A Practical Threshold Test Generation for Error Tolerant Application" in IEICE TRANSACTIONS on Information,
vol. E93-D, no. 10, pp. 2776-2782, October 2010, doi: 10.1587/transinf.E93.D.2776.
Abstract: Threshold testing, which is an LSI testing method based on the acceptability of faults, is effective in yield enhancement of LSIs and selective hardening for LSI systems. In this paper, we propose test generation models for threshold test generation. Using the proposed models, we can efficiently identify acceptable faults and generate test patterns for unacceptable faults with a general test generation algorithm, i.e., without a test generation algorithm specialized for threshold testing. Experimental results show that our approach is, in practice, effective.
URL: https://global.ieice.org/en_transactions/information/10.1587/transinf.E93.D.2776/_p
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@ARTICLE{e93-d_10_2776,
author={Hideyuki ICHIHARA, Kenta SUTOH, Yuki YOSHIKAWA, Tomoo INOUE, },
journal={IEICE TRANSACTIONS on Information},
title={A Practical Threshold Test Generation for Error Tolerant Application},
year={2010},
volume={E93-D},
number={10},
pages={2776-2782},
abstract={Threshold testing, which is an LSI testing method based on the acceptability of faults, is effective in yield enhancement of LSIs and selective hardening for LSI systems. In this paper, we propose test generation models for threshold test generation. Using the proposed models, we can efficiently identify acceptable faults and generate test patterns for unacceptable faults with a general test generation algorithm, i.e., without a test generation algorithm specialized for threshold testing. Experimental results show that our approach is, in practice, effective.},
keywords={},
doi={10.1587/transinf.E93.D.2776},
ISSN={1745-1361},
month={October},}
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TY - JOUR
TI - A Practical Threshold Test Generation for Error Tolerant Application
T2 - IEICE TRANSACTIONS on Information
SP - 2776
EP - 2782
AU - Hideyuki ICHIHARA
AU - Kenta SUTOH
AU - Yuki YOSHIKAWA
AU - Tomoo INOUE
PY - 2010
DO - 10.1587/transinf.E93.D.2776
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E93-D
IS - 10
JA - IEICE TRANSACTIONS on Information
Y1 - October 2010
AB - Threshold testing, which is an LSI testing method based on the acceptability of faults, is effective in yield enhancement of LSIs and selective hardening for LSI systems. In this paper, we propose test generation models for threshold test generation. Using the proposed models, we can efficiently identify acceptable faults and generate test patterns for unacceptable faults with a general test generation algorithm, i.e., without a test generation algorithm specialized for threshold testing. Experimental results show that our approach is, in practice, effective.
ER -
English
