The equivalent circuit constants of a packaged IMPATT diode were precisely determined from measured impedance data employing numerical calculations. The errors included in the element values are estimated to be small from the comparison of the measured and the calculated input impedances of the circuits.
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Ikuo SUEMUNE, Tadasu KAWANO, "Method of Determining Equivalent Circuit Constants of Packaged IMPATT Diode" in IEICE TRANSACTIONS on transactions,
vol. E61-E, no. 8, pp. 633-634, August 1978, doi: .
Abstract: The equivalent circuit constants of a packaged IMPATT diode were precisely determined from measured impedance data employing numerical calculations. The errors included in the element values are estimated to be small from the comparison of the measured and the calculated input impedances of the circuits.
URL: https://global.ieice.org/en_transactions/transactions/10.1587/e61-e_8_633/_p
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@ARTICLE{e61-e_8_633,
author={Ikuo SUEMUNE, Tadasu KAWANO, },
journal={IEICE TRANSACTIONS on transactions},
title={Method of Determining Equivalent Circuit Constants of Packaged IMPATT Diode},
year={1978},
volume={E61-E},
number={8},
pages={633-634},
abstract={The equivalent circuit constants of a packaged IMPATT diode were precisely determined from measured impedance data employing numerical calculations. The errors included in the element values are estimated to be small from the comparison of the measured and the calculated input impedances of the circuits.},
keywords={},
doi={},
ISSN={},
month={August},}
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TY - JOUR
TI - Method of Determining Equivalent Circuit Constants of Packaged IMPATT Diode
T2 - IEICE TRANSACTIONS on transactions
SP - 633
EP - 634
AU - Ikuo SUEMUNE
AU - Tadasu KAWANO
PY - 1978
DO -
JO - IEICE TRANSACTIONS on transactions
SN -
VL - E61-E
IS - 8
JA - IEICE TRANSACTIONS on transactions
Y1 - August 1978
AB - The equivalent circuit constants of a packaged IMPATT diode were precisely determined from measured impedance data employing numerical calculations. The errors included in the element values are estimated to be small from the comparison of the measured and the calculated input impedances of the circuits.
ER -