Gyrotropic thin-film waveguides with isotropic top layers are discussed using hybrid modes. The fundamental propagation properties of optical waves and TE-TM mode conversion efficiencies are estimated. When refractive indices of isotropic top layers are equal to those of substrates, 50% TE-TM mode conversion efficiency required for non-reciprocal circuits of optical isolators can be realized with gyrotropic films. From a fabricational point of view, these structures are very useful for constructing thin-film optical isolators because no severe control on film thickness is necessary and film growth of amorphous materials on YIG crystal films is possible for top layers. The design data for non-reciprocal circuits consisting of ZnO/YIG/GGG layered structure are presented from the hybrid mode analysis. The thickness of YIG and ZnO are 3.43 µm and 1.03 µm respectively and the length of the device is 2.28 mm. The non-reciprocal circuits of this structure can be experimentally fabricated by RF sputtering method.
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Copy
Kazunari TAKI, Yasumitsu MIYAZAKI, Yasuo AKAO, "Optical Propagation and Conversion Properties of Hybrid Modes in YIG Thin-Film Waveguides on GGG Substrates Using Faraday Effects with Isotropic Top Layers" in IEICE TRANSACTIONS on transactions,
vol. E63-E, no. 10, pp. 754-761, October 1980, doi: .
Abstract: Gyrotropic thin-film waveguides with isotropic top layers are discussed using hybrid modes. The fundamental propagation properties of optical waves and TE-TM mode conversion efficiencies are estimated. When refractive indices of isotropic top layers are equal to those of substrates, 50% TE-TM mode conversion efficiency required for non-reciprocal circuits of optical isolators can be realized with gyrotropic films. From a fabricational point of view, these structures are very useful for constructing thin-film optical isolators because no severe control on film thickness is necessary and film growth of amorphous materials on YIG crystal films is possible for top layers. The design data for non-reciprocal circuits consisting of ZnO/YIG/GGG layered structure are presented from the hybrid mode analysis. The thickness of YIG and ZnO are 3.43 µm and 1.03 µm respectively and the length of the device is 2.28 mm. The non-reciprocal circuits of this structure can be experimentally fabricated by RF sputtering method.
URL: https://global.ieice.org/en_transactions/transactions/10.1587/e63-e_10_754/_p
Copy
@ARTICLE{e63-e_10_754,
author={Kazunari TAKI, Yasumitsu MIYAZAKI, Yasuo AKAO, },
journal={IEICE TRANSACTIONS on transactions},
title={Optical Propagation and Conversion Properties of Hybrid Modes in YIG Thin-Film Waveguides on GGG Substrates Using Faraday Effects with Isotropic Top Layers},
year={1980},
volume={E63-E},
number={10},
pages={754-761},
abstract={Gyrotropic thin-film waveguides with isotropic top layers are discussed using hybrid modes. The fundamental propagation properties of optical waves and TE-TM mode conversion efficiencies are estimated. When refractive indices of isotropic top layers are equal to those of substrates, 50% TE-TM mode conversion efficiency required for non-reciprocal circuits of optical isolators can be realized with gyrotropic films. From a fabricational point of view, these structures are very useful for constructing thin-film optical isolators because no severe control on film thickness is necessary and film growth of amorphous materials on YIG crystal films is possible for top layers. The design data for non-reciprocal circuits consisting of ZnO/YIG/GGG layered structure are presented from the hybrid mode analysis. The thickness of YIG and ZnO are 3.43 µm and 1.03 µm respectively and the length of the device is 2.28 mm. The non-reciprocal circuits of this structure can be experimentally fabricated by RF sputtering method.},
keywords={},
doi={},
ISSN={},
month={October},}
Copy
TY - JOUR
TI - Optical Propagation and Conversion Properties of Hybrid Modes in YIG Thin-Film Waveguides on GGG Substrates Using Faraday Effects with Isotropic Top Layers
T2 - IEICE TRANSACTIONS on transactions
SP - 754
EP - 761
AU - Kazunari TAKI
AU - Yasumitsu MIYAZAKI
AU - Yasuo AKAO
PY - 1980
DO -
JO - IEICE TRANSACTIONS on transactions
SN -
VL - E63-E
IS - 10
JA - IEICE TRANSACTIONS on transactions
Y1 - October 1980
AB - Gyrotropic thin-film waveguides with isotropic top layers are discussed using hybrid modes. The fundamental propagation properties of optical waves and TE-TM mode conversion efficiencies are estimated. When refractive indices of isotropic top layers are equal to those of substrates, 50% TE-TM mode conversion efficiency required for non-reciprocal circuits of optical isolators can be realized with gyrotropic films. From a fabricational point of view, these structures are very useful for constructing thin-film optical isolators because no severe control on film thickness is necessary and film growth of amorphous materials on YIG crystal films is possible for top layers. The design data for non-reciprocal circuits consisting of ZnO/YIG/GGG layered structure are presented from the hybrid mode analysis. The thickness of YIG and ZnO are 3.43 µm and 1.03 µm respectively and the length of the device is 2.28 mm. The non-reciprocal circuits of this structure can be experimentally fabricated by RF sputtering method.
ER -