Evaporated Ni thin films being formed on a bulk Ni electrode were eroded by a single break are in resistive circuit. A model of the crater formation was proposed from observations of the eroded area by Scanning Electron Microscope.
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Kagehiro ITOYAMA, "Process of the Crater Formation in Ni Electrode by a Single Break Arc" in IEICE TRANSACTIONS on transactions,
vol. E63-E, no. 7, pp. 528-529, July 1980, doi: .
Abstract: Evaporated Ni thin films being formed on a bulk Ni electrode were eroded by a single break are in resistive circuit. A model of the crater formation was proposed from observations of the eroded area by Scanning Electron Microscope.
URL: https://global.ieice.org/en_transactions/transactions/10.1587/e63-e_7_528/_p
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@ARTICLE{e63-e_7_528,
author={Kagehiro ITOYAMA, },
journal={IEICE TRANSACTIONS on transactions},
title={Process of the Crater Formation in Ni Electrode by a Single Break Arc},
year={1980},
volume={E63-E},
number={7},
pages={528-529},
abstract={Evaporated Ni thin films being formed on a bulk Ni electrode were eroded by a single break are in resistive circuit. A model of the crater formation was proposed from observations of the eroded area by Scanning Electron Microscope.},
keywords={},
doi={},
ISSN={},
month={July},}
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TY - JOUR
TI - Process of the Crater Formation in Ni Electrode by a Single Break Arc
T2 - IEICE TRANSACTIONS on transactions
SP - 528
EP - 529
AU - Kagehiro ITOYAMA
PY - 1980
DO -
JO - IEICE TRANSACTIONS on transactions
SN -
VL - E63-E
IS - 7
JA - IEICE TRANSACTIONS on transactions
Y1 - July 1980
AB - Evaporated Ni thin films being formed on a bulk Ni electrode were eroded by a single break are in resistive circuit. A model of the crater formation was proposed from observations of the eroded area by Scanning Electron Microscope.
ER -