Scattering Losses Caused by Irregular Boundary Interfaces and Refractive Index Fluctuations in a Thin-Film Waveguide
Summary :
Any imperfections of a dielectric thin-film waveguide can be mainly classified into the irregular boundary interfaces and the refractive-index fluctuations. In this report we demonstrate a simple method to obtain the scattering losses caused by the two typical imperfections in terms of the coupled power coefficients.
- Publication
- IEICE TRANSACTIONS on transactions Vol.E63-E No.8 pp.588-589
- Publication Date
- 1980/08/25
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- LETTER
- Category
- Optical and Quantum Electronics
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Jiro YAMAKITA, Katsu ROKUSHIMA, "Scattering Losses Caused by Irregular Boundary Interfaces and Refractive Index Fluctuations in a Thin-Film Waveguide" in IEICE TRANSACTIONS on transactions,
vol. E63-E, no. 8, pp. 588-589, August 1980, doi: .
Abstract: Any imperfections of a dielectric thin-film waveguide can be mainly classified into the irregular boundary interfaces and the refractive-index fluctuations. In this report we demonstrate a simple method to obtain the scattering losses caused by the two typical imperfections in terms of the coupled power coefficients.
URL: https://global.ieice.org/en_transactions/transactions/10.1587/e63-e_8_588/_p
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@ARTICLE{e63-e_8_588,
author={Jiro YAMAKITA, Katsu ROKUSHIMA, },
journal={IEICE TRANSACTIONS on transactions},
title={Scattering Losses Caused by Irregular Boundary Interfaces and Refractive Index Fluctuations in a Thin-Film Waveguide},
year={1980},
volume={E63-E},
number={8},
pages={588-589},
abstract={Any imperfections of a dielectric thin-film waveguide can be mainly classified into the irregular boundary interfaces and the refractive-index fluctuations. In this report we demonstrate a simple method to obtain the scattering losses caused by the two typical imperfections in terms of the coupled power coefficients.},
keywords={},
doi={},
ISSN={},
month={August},}
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TY - JOUR
TI - Scattering Losses Caused by Irregular Boundary Interfaces and Refractive Index Fluctuations in a Thin-Film Waveguide
T2 - IEICE TRANSACTIONS on transactions
SP - 588
EP - 589
AU - Jiro YAMAKITA
AU - Katsu ROKUSHIMA
PY - 1980
DO -
JO - IEICE TRANSACTIONS on transactions
SN -
VL - E63-E
IS - 8
JA - IEICE TRANSACTIONS on transactions
Y1 - August 1980
AB - Any imperfections of a dielectric thin-film waveguide can be mainly classified into the irregular boundary interfaces and the refractive-index fluctuations. In this report we demonstrate a simple method to obtain the scattering losses caused by the two typical imperfections in terms of the coupled power coefficients.
ER -
English
