The Investigation of Zirconiated Tungsten Field Emitter by Field Ion Microscopy

Toru INOUE; Eizi SUGATA

The Investigation of Zirconiated Tungsten Field Emitter by Field Ion Microscopy

Toru INOUE, Eizi SUGATA

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In the previous paper, the chemical composition analysis of Zirconiated tungsten field emitters was reported. In this paper, behavior of Zr atoms on a W-single crystal surface in the nitrogen atmosphere and in the oxygen was investigated by FIM micrograph. Image patterns of the micrograph were taken when the W-single crystal emitter tip of 100 direction was annealed at 1100 for 10 minutes in the presence of 310^-6 torr oxygen gas. It seems suitable to explain on the image patterns that zirconium oxide layers are formed. However, the phenomenon of the (100) surface build-up was not observed as much degree in the oxygen presence as in the presence of 610^-6 torr nitrogen gas.

Publication: IEICE TRANSACTIONS on transactions Vol.E65-E No.9 pp.517-521

Publication Date: 1982/09/25

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Type of Manuscript: PAPER

Category: Electron Devices

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Toru INOUE
Eizi SUGATA

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Toru INOUE, Eizi SUGATA, "The Investigation of Zirconiated Tungsten Field Emitter by Field Ion Microscopy" in IEICE TRANSACTIONS on transactions, vol. E65-E, no. 9, pp. 517-521, September 1982, doi: .
Abstract: In the previous paper, the chemical composition analysis of Zirconiated tungsten field emitters was reported. In this paper, behavior of Zr atoms on a W-single crystal surface in the nitrogen atmosphere and in the oxygen was investigated by FIM micrograph. Image patterns of the micrograph were taken when the W-single crystal emitter tip of 100 direction was annealed at 1100 for 10 minutes in the presence of 310^-6 torr oxygen gas. It seems suitable to explain on the image patterns that zirconium oxide layers are formed. However, the phenomenon of the (100) surface build-up was not observed as much degree in the oxygen presence as in the presence of 610^-6 torr nitrogen gas.
URL: https://global.ieice.org/en_transactions/transactions/10.1587/e65-e_9_517/_p

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@ARTICLE{e65-e_9_517,
author={Toru INOUE, Eizi SUGATA, },
journal={IEICE TRANSACTIONS on transactions},
title={The Investigation of Zirconiated Tungsten Field Emitter by Field Ion Microscopy},
year={1982},
volume={E65-E},
number={9},
pages={517-521},
abstract={In the previous paper, the chemical composition analysis of Zirconiated tungsten field emitters was reported. In this paper, behavior of Zr atoms on a W-single crystal surface in the nitrogen atmosphere and in the oxygen was investigated by FIM micrograph. Image patterns of the micrograph were taken when the W-single crystal emitter tip of 100 direction was annealed at 1100 for 10 minutes in the presence of 310^-6 torr oxygen gas. It seems suitable to explain on the image patterns that zirconium oxide layers are formed. However, the phenomenon of the (100) surface build-up was not observed as much degree in the oxygen presence as in the presence of 610^-6 torr nitrogen gas.},
keywords={},
doi={},
ISSN={},
month={September},}

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TY - JOUR
TI - The Investigation of Zirconiated Tungsten Field Emitter by Field Ion Microscopy
T2 - IEICE TRANSACTIONS on transactions
SP - 517
EP - 521
AU - Toru INOUE
AU - Eizi SUGATA
PY - 1982
DO -
JO - IEICE TRANSACTIONS on transactions
SN -
VL - E65-E
IS - 9
JA - IEICE TRANSACTIONS on transactions
Y1 - September 1982
AB - In the previous paper, the chemical composition analysis of Zirconiated tungsten field emitters was reported. In this paper, behavior of Zr atoms on a W-single crystal surface in the nitrogen atmosphere and in the oxygen was investigated by FIM micrograph. Image patterns of the micrograph were taken when the W-single crystal emitter tip of 100 direction was annealed at 1100 for 10 minutes in the presence of 310^-6 torr oxygen gas. It seems suitable to explain on the image patterns that zirconium oxide layers are formed. However, the phenomenon of the (100) surface build-up was not observed as much degree in the oxygen presence as in the presence of 610^-6 torr nitrogen gas.
ER -