IEICE TRANSACTIONS on transactions
Properties of nm Bridge on Edge Junction
Summary :
Thermal oxidation and liftoff technique have been used to fabricate the niobium nm bridge on an edge junction. The bridges had an effective length of less than 50 nm and width of 2 µm. Experimental results of the threshold curves of the DC-SQUID at 4.2 K are in excellent agreement with calculations based on a sinusoidal current-phase relation. Very sharp microwave-induced steps were also observed, and the bridges were found to show Josephson effect in a wide range of temperature.
- Publication
- IEICE TRANSACTIONS on transactions Vol.E67-E No.2 pp.123-124
- Publication Date
- 1984/02/25
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- LETTER
- Category
- Electron Devices
Authors
Keyword
Latest Issue
Copyrights notice of machine-translated contents
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Cite this
Copy
Katsuyoshi HAMASAKI, Kazutake MATSUMOTO, Yoshimitsu KODAIRA, Toranosuke KOMATA, Tsutomu YAMASHITA, "Properties of nm Bridge on Edge Junction" in IEICE TRANSACTIONS on transactions,
vol. E67-E, no. 2, pp. 123-124, February 1984, doi: .
Abstract: Thermal oxidation and liftoff technique have been used to fabricate the niobium nm bridge on an edge junction. The bridges had an effective length of less than 50 nm and width of 2 µm. Experimental results of the threshold curves of the DC-SQUID at 4.2 K are in excellent agreement with calculations based on a sinusoidal current-phase relation. Very sharp microwave-induced steps were also observed, and the bridges were found to show Josephson effect in a wide range of temperature.
URL: https://global.ieice.org/en_transactions/transactions/10.1587/e67-e_2_123/_p
Copy
@ARTICLE{e67-e_2_123,
author={Katsuyoshi HAMASAKI, Kazutake MATSUMOTO, Yoshimitsu KODAIRA, Toranosuke KOMATA, Tsutomu YAMASHITA, },
journal={IEICE TRANSACTIONS on transactions},
title={Properties of nm Bridge on Edge Junction},
year={1984},
volume={E67-E},
number={2},
pages={123-124},
abstract={Thermal oxidation and liftoff technique have been used to fabricate the niobium nm bridge on an edge junction. The bridges had an effective length of less than 50 nm and width of 2 µm. Experimental results of the threshold curves of the DC-SQUID at 4.2 K are in excellent agreement with calculations based on a sinusoidal current-phase relation. Very sharp microwave-induced steps were also observed, and the bridges were found to show Josephson effect in a wide range of temperature.},
keywords={},
doi={},
ISSN={},
month={February},}
Copy
TY - JOUR
TI - Properties of nm Bridge on Edge Junction
T2 - IEICE TRANSACTIONS on transactions
SP - 123
EP - 124
AU - Katsuyoshi HAMASAKI
AU - Kazutake MATSUMOTO
AU - Yoshimitsu KODAIRA
AU - Toranosuke KOMATA
AU - Tsutomu YAMASHITA
PY - 1984
DO -
JO - IEICE TRANSACTIONS on transactions
SN -
VL - E67-E
IS - 2
JA - IEICE TRANSACTIONS on transactions
Y1 - February 1984
AB - Thermal oxidation and liftoff technique have been used to fabricate the niobium nm bridge on an edge junction. The bridges had an effective length of less than 50 nm and width of 2 µm. Experimental results of the threshold curves of the DC-SQUID at 4.2 K are in excellent agreement with calculations based on a sinusoidal current-phase relation. Very sharp microwave-induced steps were also observed, and the bridges were found to show Josephson effect in a wide range of temperature.
ER -
English
