Many software reliability growth models have been proposed in the last decade, based on software error data observed during testing phase in the software development. However, the existing models are insufficient to represent the time-dependent behavior of testing-effort expenditures in the actual environment of the software testing. For this reason we develop and investigate a testing-effort dependent reliability model incorporating the testing-effort spent on software testing into the software reliability growth. The model is described by a non-homogeneous Poisson process, assuming that the error detection rate to the amount of testing-effort spent at an arbitrary testing time is proportional to the current error content. The time-dependent behavior of testing-effort expenditures is described by a Weibull curve due to the flexibility. From this model, the quantitative software reliability measures are derived. The estimations for the testing-effort parameters and the reliability growth parameters in the model are given by a method of least-squares and by a method of maximum-likelihood, respectively. Then, statistical inferences on the model parameters and the software reliability measures, and analyses of actual software error data and studied.
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Shigeru YAMADA, Hiroshi OHTERA, Hiroyuki NARIHISA, "A Testing-Effort Dependent Reliability Model for Computer Programs" in IEICE TRANSACTIONS on transactions,
vol. E69-E, no. 11, pp. 1217-1224, November 1986, doi: .
Abstract: Many software reliability growth models have been proposed in the last decade, based on software error data observed during testing phase in the software development. However, the existing models are insufficient to represent the time-dependent behavior of testing-effort expenditures in the actual environment of the software testing. For this reason we develop and investigate a testing-effort dependent reliability model incorporating the testing-effort spent on software testing into the software reliability growth. The model is described by a non-homogeneous Poisson process, assuming that the error detection rate to the amount of testing-effort spent at an arbitrary testing time is proportional to the current error content. The time-dependent behavior of testing-effort expenditures is described by a Weibull curve due to the flexibility. From this model, the quantitative software reliability measures are derived. The estimations for the testing-effort parameters and the reliability growth parameters in the model are given by a method of least-squares and by a method of maximum-likelihood, respectively. Then, statistical inferences on the model parameters and the software reliability measures, and analyses of actual software error data and studied.
URL: https://global.ieice.org/en_transactions/transactions/10.1587/e69-e_11_1217/_p
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@ARTICLE{e69-e_11_1217,
author={Shigeru YAMADA, Hiroshi OHTERA, Hiroyuki NARIHISA, },
journal={IEICE TRANSACTIONS on transactions},
title={A Testing-Effort Dependent Reliability Model for Computer Programs},
year={1986},
volume={E69-E},
number={11},
pages={1217-1224},
abstract={Many software reliability growth models have been proposed in the last decade, based on software error data observed during testing phase in the software development. However, the existing models are insufficient to represent the time-dependent behavior of testing-effort expenditures in the actual environment of the software testing. For this reason we develop and investigate a testing-effort dependent reliability model incorporating the testing-effort spent on software testing into the software reliability growth. The model is described by a non-homogeneous Poisson process, assuming that the error detection rate to the amount of testing-effort spent at an arbitrary testing time is proportional to the current error content. The time-dependent behavior of testing-effort expenditures is described by a Weibull curve due to the flexibility. From this model, the quantitative software reliability measures are derived. The estimations for the testing-effort parameters and the reliability growth parameters in the model are given by a method of least-squares and by a method of maximum-likelihood, respectively. Then, statistical inferences on the model parameters and the software reliability measures, and analyses of actual software error data and studied.},
keywords={},
doi={},
ISSN={},
month={November},}
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TY - JOUR
TI - A Testing-Effort Dependent Reliability Model for Computer Programs
T2 - IEICE TRANSACTIONS on transactions
SP - 1217
EP - 1224
AU - Shigeru YAMADA
AU - Hiroshi OHTERA
AU - Hiroyuki NARIHISA
PY - 1986
DO -
JO - IEICE TRANSACTIONS on transactions
SN -
VL - E69-E
IS - 11
JA - IEICE TRANSACTIONS on transactions
Y1 - November 1986
AB - Many software reliability growth models have been proposed in the last decade, based on software error data observed during testing phase in the software development. However, the existing models are insufficient to represent the time-dependent behavior of testing-effort expenditures in the actual environment of the software testing. For this reason we develop and investigate a testing-effort dependent reliability model incorporating the testing-effort spent on software testing into the software reliability growth. The model is described by a non-homogeneous Poisson process, assuming that the error detection rate to the amount of testing-effort spent at an arbitrary testing time is proportional to the current error content. The time-dependent behavior of testing-effort expenditures is described by a Weibull curve due to the flexibility. From this model, the quantitative software reliability measures are derived. The estimations for the testing-effort parameters and the reliability growth parameters in the model are given by a method of least-squares and by a method of maximum-likelihood, respectively. Then, statistical inferences on the model parameters and the software reliability measures, and analyses of actual software error data and studied.
ER -