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A Testing-Effort Dependent Reliability Model for Computer Programs

Shigeru YAMADA, Hiroshi OHTERA, Hiroyuki NARIHISA

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Summary :

Many software reliability growth models have been proposed in the last decade, based on software error data observed during testing phase in the software development. However, the existing models are insufficient to represent the time-dependent behavior of testing-effort expenditures in the actual environment of the software testing. For this reason we develop and investigate a testing-effort dependent reliability model incorporating the testing-effort spent on software testing into the software reliability growth. The model is described by a non-homogeneous Poisson process, assuming that the error detection rate to the amount of testing-effort spent at an arbitrary testing time is proportional to the current error content. The time-dependent behavior of testing-effort expenditures is described by a Weibull curve due to the flexibility. From this model, the quantitative software reliability measures are derived. The estimations for the testing-effort parameters and the reliability growth parameters in the model are given by a method of least-squares and by a method of maximum-likelihood, respectively. Then, statistical inferences on the model parameters and the software reliability measures, and analyses of actual software error data and studied.

Publication
IEICE TRANSACTIONS on transactions Vol.E69-E No.11 pp.1217-1224
Publication Date
1986/11/25
Publicized
Online ISSN
DOI
Type of Manuscript
PAPER
Category
Software Technology

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