The search functionality is under construction.
The search functionality is under construction.

The Interfacial Characteristics of MIS Structures Using Carbon Films as Insulator

Kiyoshi ISHII, Hiroto TAKEUCHI, Hiroaki MAKIMURA, Kiichi KAMIMURA, Yoshiharu ONUMA

  • Full Text Views

    0

  • Cite this

Summary :

Hard and insulating carbon films were prepared by r.f. plasma chemical vapor deposition with d.c. bias. The interfacial characteristics of MIS structures using carbon films as insulator were investigated. The interface state density was 1011eV1cm2 for carbon-Si and carbon-InP MIS diodes.

Publication
IEICE TRANSACTIONS on transactions Vol.E69-E No.4 pp.479-481
Publication Date
1986/04/25
Publicized
Online ISSN
DOI
Type of Manuscript
Special Section LETTER (Special Issue: Papers from 1986 National Convention IECE Japan)
Category
Materials

Authors

Keyword