The propagation constant, the effective index, the effective guide thickness and the refractive index has been measured by using the method of a variable spacing of a high-index film and the waveguide surface. The spacing can be varied by the electrostrictive element.
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Minoru KAWANO, Hiroyuki KUROKAWA, Isamu KATO, Koki SATO, "Non-contact Characterization of Optical Waveguides by the Method of a Variable Spacing of a High-Index Film and the Waveguide Surface" in IEICE TRANSACTIONS on transactions,
vol. E72-E, no. 4, pp. 272-274, April 1989, doi: .
Abstract: The propagation constant, the effective index, the effective guide thickness and the refractive index has been measured by using the method of a variable spacing of a high-index film and the waveguide surface. The spacing can be varied by the electrostrictive element.
URL: https://global.ieice.org/en_transactions/transactions/10.1587/e72-e_4_272/_p
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@ARTICLE{e72-e_4_272,
author={Minoru KAWANO, Hiroyuki KUROKAWA, Isamu KATO, Koki SATO, },
journal={IEICE TRANSACTIONS on transactions},
title={Non-contact Characterization of Optical Waveguides by the Method of a Variable Spacing of a High-Index Film and the Waveguide Surface},
year={1989},
volume={E72-E},
number={4},
pages={272-274},
abstract={The propagation constant, the effective index, the effective guide thickness and the refractive index has been measured by using the method of a variable spacing of a high-index film and the waveguide surface. The spacing can be varied by the electrostrictive element.},
keywords={},
doi={},
ISSN={},
month={April},}
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TY - JOUR
TI - Non-contact Characterization of Optical Waveguides by the Method of a Variable Spacing of a High-Index Film and the Waveguide Surface
T2 - IEICE TRANSACTIONS on transactions
SP - 272
EP - 274
AU - Minoru KAWANO
AU - Hiroyuki KUROKAWA
AU - Isamu KATO
AU - Koki SATO
PY - 1989
DO -
JO - IEICE TRANSACTIONS on transactions
SN -
VL - E72-E
IS - 4
JA - IEICE TRANSACTIONS on transactions
Y1 - April 1989
AB - The propagation constant, the effective index, the effective guide thickness and the refractive index has been measured by using the method of a variable spacing of a high-index film and the waveguide surface. The spacing can be varied by the electrostrictive element.
ER -