To accurately evaluate and manage future distributed wireless networks, it is indispensable to fully understand cooperative propagation channels. In this contribution, we propose cascaded multi-keyhole channel models for analyzing cooperative diversity wireless communications. The cascaded Wishart distribution is adopted to investigate the eigenvalue distribution of the multi-keyhole MIMO (multiple input multiple output) channel matrix, and the capacity performance is also presented for the wireless systems over such channels. A diversity order approximation method is proposed for better evaluating the eigenvalue and capacity distributions. The good match of analytical derivations and numerical simulations validates the proposed models and analysis methods. The proposed models can provide an important reference for the optimization and management of cooperative diversity wireless networks.

A two stage non-scan design for testability method is proposed. The first stage selects test points based on an earlier testability measure conflict. A new design for testability algorithm is proposed to select test points by a fault-oriented testability measure conflict+ in the second stage. Test points are selected in the second stage based on the hard faults after the initial ATPG run of the design for testability circuit in the preliminary stage. The new testability measure conflict+ based on conflict analysis of hard-faults in the process of test generation is introduced, which emulates most general features of sequential ATPG. The new testability measure reduces testability of a fault to the minimum D or controllability of the primary outputs, and therefore, does not need observability measure any more. Effective approximate schemes are adopted to get reasonable estimation of the testability measure. A couple of effective techniques are also adopted to accelerate the process of the proposed design for testability algorithm. Experimental results show that the proposed method gets even better results than two of the recent non-scan design for testability methods nscan and lcdft.