1-1hit |
Geshu FUSE Ichirou NAKAO Yohei ICHIKAWA Chiaki KUDO Toshiki YABU Akito UNO Kazuyuki SAWADA Yasushi NAITO Michihiro INOUE Hiroshi IWASAKI
Leakage current in SCC DRAM was reduced by optimizing implant conditions to form channel stopper, node connection and Hi-C boron. To reduce leakage current, the implantation doses should be reduced to reduce implant induced damages. These implant dose reductions are compromised to the necessities of high p type concentration to prevent punch-throughs at several parts of the cell. Near the deep trench bottom, damaged region due to Hi-C boron implant is separated from the bottom edge of the n+ storage node to suppress the gate controlled leakage current. By the improvements, the retention time of the 16 M SCC DRAM becomes over 30 sec at room temperature. It is also shown that folded bit line structure could be adopted easily for SCC.