For the direct measurement of very fast transient current (VFTC) due to switch operation in gas insulated switchgear (GIS), usually it will interfere the original operation or change the structure of switch. In this paper a method for calculation of transient current caused by the disconnect operation in GIS by the inverse operation of the electromagnetic (EM) near field is presented. A GIS is modeled by the finite integration technique (FIT), and all the media between the excitation source and the observation position are considered as a black box whose input is VFTC and output is EM field. A coefficient matrix is established to reflect the connection between the input and output in frequency domain, and the VFTC in frequency domain will be the result of multiplying the inverse matrix by the measurement result minus the EM field caused by transient grounding potential rise (TGPR) or transient enclosure voltage (TEV) in the observation position. Finally the time domain form of VFTC can be obtained by the interpolation and IFFT. Comparison between the result and simulation shows the validation of this method.

This paper presents an accurate and systematic method to simulate the interference imposed on the input/output (I/O) ports of electronic equipment under the electrical fast transients/burst (EFT/B) test. The equivalent circuit of the EFT/B generator and the coupling clamp are modeled respectively. Firstly, a transfer function (TF) of the EFT pulse-forming network is constructed with the latent parameters based on circuit theory. In the TF, two negative real parameters characterize the non-oscillation process of the network while one complex conjugate pair characterizes the damping-oscillation process. The TF of the pulse-forming network is therefore synthesized in the equivalent circuit of the EFT/B generator. Secondly, the standard coupling clamp is modeled based on the scatter (S) parameter obtained by using a vector network analyzer. By applying the vector fitting method during the rational function approximation, a macromodel of the coupling clamp can be obtained and converted to a Spice compatible equivalent circuit. Based on the aforementioned procedures, the interference imposed on the I/O ports can be simulated. The modeling methods are validated experimentally, where the interference in differential mode and common mode is evaluated respectively.