In this paper, a compact channel thermal noise model for short-channel MOSFETs is presented and applied to the radio frequency integrated circuit (RFIC) design. Based on the analysis of the relationship among different short-channel effects such as velocity saturation effect (VSE), channel-length modulation (CLM), and carrier heating effect (CHE), the compact model for the channel thermal noise was analytically derived as a simple form. In order to simulate MOSFET's noise characteristics in circuit simulators, an appropriate methodology is proposed. The used compact noise model is verified by comparing simulated results to the measured data at device and circuit level by using 65 nm and 130 nm CMOS technologies, respectively.

Free/libre open source software (FLOSS) are being rapidly employed in several companies and organizations, because it can be modified and used for free. Hence, the use of FLOSS could contribute to its originally intended benefits and to the competence of its users. In this study, we analyzed the effect of using FLOSS on related competences. We investigated the change in the competences through an empirical study before and after the use of FLOSS among project participants. Consequently, it was confirmed that the competences of the participants improved after utilizing FLOSS.