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[Author] Masahiro SEKIYA(3hit)

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  • Design of a Sub-1. 5 V, 20 MHz, 0. 1% MOS Current-Mode Sample-and-Hold Circuit

    Yasuhiro SUGIMOTO  Masahiro SEKIYA  

     
    LETTER

      Vol:
    E81-A No:2
      Page(s):
    258-260

    This paper describes an MOS current-mode sample-and-hold (S/H) circuit that potentially operates with a sub-1. 5 V supply voltage, 20 MHz clock frequency, and less than 0. 1% linearity. A newly developed voltage-to-current converter suppresses the voltage change at an input terminal and achieves low-voltage operation with superior linearity. Sample switches are differentially placed at the inputs of a differential amplifier so that the feedthrough errors from switches cancel out. The MOS current-mode S/H circuit is designed and simulated using CMOS 0. 6 µm device parameters. Simulation results indicate that an operation with 20 MHz clock frequency, linearity error of less than 0. 1%, and 1 MHz input from a 1. 5 V power supply is achievable.

  • A Study of the Signal-to-Noise Ratio of a High-Speed Current-Mode CMOS Sample-and-Hold Circuit

    Yasuhiro SUGIMOTO  Masahiro SEKIYA  Tetsuya IIDA  

     
    PAPER

      Vol:
    E80-A No:10
      Page(s):
    1986-1993

    Our study investigated the realization of a high-precision MOS current-mode circuit. Simple studies have implied that it is difficult to achieve a high signal-to-noise ratio (S/N) in a current-mode circuit. Since the signal voltage at the internal node is suppressed, the circuit is sensitive to various noise sources. To investigate this, we designed and fabricated a current-mode sample-and-hold circuit with a 3V power supply and a 20MHz clock speed, using a standard CMOS 0.6µm device process. The measured S/N reached 57dB and 59dB in sample mode, and 51dB and 54dB in sample-and-hold mode, with 115µA from a 3V power supply and 220µA from a 5V power supply of input currents and a 10MHz noise bandwidth. The S/N analysis based on an actual circuit was done taking device noise sources and the fold-over phenomena of noise in a sampled system into account. The calculation showed 66.9dB of S/N in sample mode and 59.5dB in sample-and-hold-mode with 115µA of input current. Both the analysis and measurement indicated that 60dB of S/N in sample mode with a 10MHz noise bandwidth is an achievable value for this sample-and-hold circuit. It was clear that the current-mode approach limits the S/N performance because of the voltage suppression method. This point should be further studied and discussed.

  • A Novel Multi-AP Diversity for Highly Reliable Transmissions in Wireless LANs

    Toshihisa NABETANI  Masahiro SEKIYA  

     
    PAPER-Terrestrial Wireless Communication/Broadcasting Technologies

      Pubricized:
    2021/01/08
      Vol:
    E104-B No:7
      Page(s):
    913-921

    With the development of the IEEE 802.11 standard for wireless LANs, there has been an enormous increase in the usage of wireless LANs in factories, plants, and other industrial environments. In industrial applications, wireless LAN systems require high reliability for stable real-time communications. In this paper, we propose a multi-access-point (AP) diversity method that contributes to the realization of robust data transmissions toward realization of ultra-reliable low-latency communications (URLLC) in wireless LANs. The proposed method can obtain a diversity effect of multipaths with independent transmission errors and collisions without modification of the IEEE 802.11 standard or increasing overhead of communication resources. We evaluate the effects of the proposed method by numerical analysis, develop a prototype to demonstrate its feasibility, and perform experiments using the prototype in a factory wireless environment. These numerical evaluations and experiments show that the proposed method increases reliability and decreases transmission delay.