This letter presents a new time-digital single-slope ADC (TDSS) architecture for CMOS image sensors. In the proposed ADC, a conventional single-slope ADC is used in coarse phase and a time to digital convertor is employed in fine phase. Through second comparison of the two different slope voltages (discharge input voltage and ramp voltage), the proposed ADC achieves low bit precision compensation. Compared with multiple-ramp single-slope (MRSS) ADC, the proposed ADC not only has a simple digital judgment circuit, but also increases conversion speed without complicated structure of ramp generator. A 10-bit TDSS ADC consisting of 7-bit conventional single-slope ADC and 3-bit time to digital converter was realized in a 0.13µm CIS process. Simulations demonstrate that the conversion speed of a TDSS ADC is almost 3.5 times faster than that of a single-slope ADC.

This letter presents a 12-bit column-parallel hybrid two-step successive approximation register/single-slope analog-to-digital converter (SAR/SS ADC) for CMOS image sensor (CIS). For achieving a high conversion speed, a simple SAR ADC is used in upper 6-bit conversion and a conventional SS ADC is used in lower 6-bit conversion. To reduce the power consumption, a comparator is shared in each column, and a 6-bit ramp generator is shared by all columns. This ADC is designed in SMIC 0.18µm CMOS process. At a clock frequency of 22.7MHz, the conversion time is 3.2µs. The ADC has a DNL of -0.31/+0.38LSB and an INL of -0.86/+0.8LSB. The power consumption of each column ADC is 89µW and the ramp generator is 763µW.