To speed up a guided-probe diagnosis process, the number of probed lines needs to be reduced. This paper presents two efficient probing line determination methods by which the number of probed lines is either small or minimum. The concept of fault probability is introduced to reflect the fact that not all gates have the same probability to be faulty. Experimental results show the effectiveness of the proposed methods.

In recent years, the domino logic has received much attention as a design technique of high-speed circuits. However, in the case of standard domino logic, only non-inverting functions are allowed. Then, the clock-delayed (CD) domino logic that provides any logic function is proposed in order to overcome such domino's drawback. In addition, domino circuits are more sensitive to circuit noise compared with static CMOS circuits. In particular, crosstalk causes critical problems. Therefore, we focus our attention on crosstalk faults in CD domino circuits. However, in CD domino circuits, there are faults that don't propagate faulty values to any primary output even though crosstalk pulses are generated. Then, we remove such faults from the target fault list by considering structures of CD domino circuits, and perform a fault simulation for the reduced target fault list using two kinds of fault simulation method together. We realize CD domino circuits in VHDL and perform the proposed fault simulation for the combinational part of some benchmark circuits of ISCAS'89 on a VHDL simulator. Fault coverage for random vectors was obtained for s27 to s1494 under the limitation of simulation time.

With the scale-down of VLSI chip size and the reduction of switching time of logic gates, crosstalk faults become an important problem in testing of VLSI. For synchronous sequential circuits, the crosstalk pulses on data lines will be considered to be harmless, because they can be invalidated by a clocking phase. However, crosstalk pulses generated on clock lines or reset lines will cause an erroneous operation. In this work, we have analyzed a crosstalk fault scheme, and developed a fault simulator based on the scheme. Throughout this work, we considered the crosstalk fault as unexpected strong capacitive coupling between one data line and one clock line. Since we must consider timing in addition to a logic value, the unit delay model is used in our fault simulation. Our experiments on some benchmark circuits show that fault activation rates and fault detection rates vary widely depending on circuit characteristics. Fault detection rates of up to 80% are obtained from our simulation with test vectors generated at random.