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Keiichi UCHIMURA Junji MICHIDA Shinji NOZU Teizo AIDA Hiroshi ECHIGO Tasuku TAKAGI
This letter deals with a newly developed automatic system, which measures the rate of malfunction of digital circuits owing to noise induced by breaking electric contacts. In this system, a personal computer is used for the detection and the count of the malfunction in the digital circuit. Its experimental results are reported here.