A highly multi-channel on-chip signal monitor and off-chip waveform acquisition processor established analog circuit diagnosis against environmental disturbances in SoC. An array of 53 distributed probes followed by a single shared waveform acquisition kernel is embedded in a 0.18-µm CMOS experimental on-chip test bench. In combination with the off-chip processor materialized in FPGA and a host PC, fully automated on-chip waveform monitoring achieves high-throughput data acquisition of 300 ms per sample point with adaptive 10-bit timing and voltage resolutions at a minimum LSB of 100 ps and 400 µV, respectively. Analog signals of interest in a 1.5-bit conversion stage of a pipeline ADC were evaluated in terms of their response to substrate noises that globally existed in a chip. On-chip diagnosis derives in-depth findings relating to dynamic, large-signal, and sensitive behaviors of analog circuits in a real SoC environment, far beyond simulations with inevitably limited capacity.