On-Chip Multi-Channel Monitoring for Analog Circuit Diagnosis in Systems-on-Chip Integration

Koichiro NOGUCHI; Takushi HASHIDA; Makoto NAGATA

doi:10.1093/ietele/e90-c.6.1189

On-Chip Multi-Channel Monitoring for Analog Circuit Diagnosis in Systems-on-Chip Integration

Koichiro NOGUCHI, Takushi HASHIDA, Makoto NAGATA

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A highly multi-channel on-chip signal monitor and off-chip waveform acquisition processor established analog circuit diagnosis against environmental disturbances in SoC. An array of 53 distributed probes followed by a single shared waveform acquisition kernel is embedded in a 0.18-µm CMOS experimental on-chip test bench. In combination with the off-chip processor materialized in FPGA and a host PC, fully automated on-chip waveform monitoring achieves high-throughput data acquisition of 300 ms per sample point with adaptive 10-bit timing and voltage resolutions at a minimum LSB of 100 ps and 400 µV, respectively. Analog signals of interest in a 1.5-bit conversion stage of a pipeline ADC were evaluated in terms of their response to substrate noises that globally existed in a chip. On-chip diagnosis derives in-depth findings relating to dynamic, large-signal, and sensitive behaviors of analog circuits in a real SoC environment, far beyond simulations with inevitably limited capacity.

Publication: IEICE TRANSACTIONS on Electronics Vol.E90-C No.6 pp.1189-1196

Publication Date: 2007/06/01

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Online ISSN: 1745-1353

DOI: 10.1093/ietele/e90-c.6.1189

Type of Manuscript: Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)

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Koichiro NOGUCHI, Takushi HASHIDA, Makoto NAGATA, "On-Chip Multi-Channel Monitoring for Analog Circuit Diagnosis in Systems-on-Chip Integration" in IEICE TRANSACTIONS on Electronics, vol. E90-C, no. 6, pp. 1189-1196, June 2007, doi: 10.1093/ietele/e90-c.6.1189.
Abstract: A highly multi-channel on-chip signal monitor and off-chip waveform acquisition processor established analog circuit diagnosis against environmental disturbances in SoC. An array of 53 distributed probes followed by a single shared waveform acquisition kernel is embedded in a 0.18-µm CMOS experimental on-chip test bench. In combination with the off-chip processor materialized in FPGA and a host PC, fully automated on-chip waveform monitoring achieves high-throughput data acquisition of 300 ms per sample point with adaptive 10-bit timing and voltage resolutions at a minimum LSB of 100 ps and 400 µV, respectively. Analog signals of interest in a 1.5-bit conversion stage of a pipeline ADC were evaluated in terms of their response to substrate noises that globally existed in a chip. On-chip diagnosis derives in-depth findings relating to dynamic, large-signal, and sensitive behaviors of analog circuits in a real SoC environment, far beyond simulations with inevitably limited capacity.
URL: https://global.ieice.org/en_transactions/electronics/10.1093/ietele/e90-c.6.1189/_p

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@ARTICLE{e90-c_6_1189,
author={Koichiro NOGUCHI, Takushi HASHIDA, Makoto NAGATA, },
journal={IEICE TRANSACTIONS on Electronics},
title={On-Chip Multi-Channel Monitoring for Analog Circuit Diagnosis in Systems-on-Chip Integration},
year={2007},
volume={E90-C},
number={6},
pages={1189-1196},
abstract={A highly multi-channel on-chip signal monitor and off-chip waveform acquisition processor established analog circuit diagnosis against environmental disturbances in SoC. An array of 53 distributed probes followed by a single shared waveform acquisition kernel is embedded in a 0.18-µm CMOS experimental on-chip test bench. In combination with the off-chip processor materialized in FPGA and a host PC, fully automated on-chip waveform monitoring achieves high-throughput data acquisition of 300 ms per sample point with adaptive 10-bit timing and voltage resolutions at a minimum LSB of 100 ps and 400 µV, respectively. Analog signals of interest in a 1.5-bit conversion stage of a pipeline ADC were evaluated in terms of their response to substrate noises that globally existed in a chip. On-chip diagnosis derives in-depth findings relating to dynamic, large-signal, and sensitive behaviors of analog circuits in a real SoC environment, far beyond simulations with inevitably limited capacity.},
keywords={},
doi={10.1093/ietele/e90-c.6.1189},
ISSN={1745-1353},
month={June},}

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TY - JOUR
TI - On-Chip Multi-Channel Monitoring for Analog Circuit Diagnosis in Systems-on-Chip Integration
T2 - IEICE TRANSACTIONS on Electronics
SP - 1189
EP - 1196
AU - Koichiro NOGUCHI
AU - Takushi HASHIDA
AU - Makoto NAGATA
PY - 2007
DO - 10.1093/ietele/e90-c.6.1189
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E90-C
IS - 6
JA - IEICE TRANSACTIONS on Electronics
Y1 - June 2007
AB - A highly multi-channel on-chip signal monitor and off-chip waveform acquisition processor established analog circuit diagnosis against environmental disturbances in SoC. An array of 53 distributed probes followed by a single shared waveform acquisition kernel is embedded in a 0.18-µm CMOS experimental on-chip test bench. In combination with the off-chip processor materialized in FPGA and a host PC, fully automated on-chip waveform monitoring achieves high-throughput data acquisition of 300 ms per sample point with adaptive 10-bit timing and voltage resolutions at a minimum LSB of 100 ps and 400 µV, respectively. Analog signals of interest in a 1.5-bit conversion stage of a pipeline ADC were evaluated in terms of their response to substrate noises that globally existed in a chip. On-chip diagnosis derives in-depth findings relating to dynamic, large-signal, and sensitive behaviors of analog circuits in a real SoC environment, far beyond simulations with inevitably limited capacity.
ER -