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[Keyword] conducted immunity(2hit)

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  • Experimental Investigation on Electromagnetic Immunity and Conduction Immunity of Digital Control Circuit Based on ARM

    Yang XIAO  Zhongyuan ZHOU  Xiang ZHOU  Qi ZHOU  Mingjie SHENG  Yixing GU  Mingliang YANG  

     
    PAPER-Electromagnetic Compatibility(EMC)

      Pubricized:
    2023/05/19
      Vol:
    E106-B No:10
      Page(s):
    969-978

    This paper analyzes the typical functions of digital control circuit and its function modules, and develops a set of digital control circuit equipment based on Advanced RISC Machines (ARM) with typical function modules, including principle design, interference injection trace design, function design, and study the failure mode and threshold of typical function modules. Based on continuous wave (CW) and pulse wave, the direct power injection (DPI) method is used to test the conduction immunity of the digital control circuit, and the failure mode and sensitivity threshold of the digital control circuit are quantitatively obtained. This method can provide experimental verification for the immunity ability of the digital control circuit to different electromagnetic interference.

  • SPICE Behavioral Modeling of RF Current Injection in Wire Bundles

    Flavia GRASSI  Giordano SPADACINI  Sergio A. PIGNARI  

     
    PAPER-Energy in Electronics Communications

      Vol:
    E97-B No:2
      Page(s):
    424-431

    In this work, a measurement-based procedure aimed at deriving a behavioral model of Bulk Current Injection (BCI) probes clamped onto multi-wire cable bundles is proposed. The procedure utilizes the measurement data obtained by mounting the probe onto the calibration jig for model-parameters extraction, and 2D electromagnetic simulations to adapt such parameters to the specific characteristics of the cable bundle under analysis. Outcome of the analysis is a behavioral model which can be easily implemented into the SPICE environment. Without loss of generality, the proposed model is here used to predict the radio-frequency noise stressing the terminal units of a two-wire harness. Model accuracy in predicting the common and differential mode voltages induced by BCI at the line terminals is assessed by EM modeling and simulation of the involved injection setup by the commercial software CST Microwave Studio.