1-2hit |
Tadayoshi HORITA Yuuji KATOU Itsuo TAKANAMI
This paper deals with redundant 3D mesh processor arrays using 1.5-track switches, considering track and switch faults together with processor faults. Four variants are defined based on the distributions of spare PEs, and arrays of three variants have the same PE redundancies among them, but the fabrication-time costs are different. We investigate in detail how the reliability of a total system changes according to the reliabilities of tracks and switches as well as PEs, and show the concrete values of Mt and Ms, when the reliability of array are almost the same even if its variant is changed, and when it is not so, respectively, where Mt and Ms are the ratio of the hardware complexities of a PE and a track, and that of a PE and a contact point of a switch, respectively. Other results which are effective basis for the design of fault-tolerant 3D PE arrays using 1.5-TSs are given.
Tadayoshi HORITA Itsuo TAKANAMI
The E-1-track switch torus array model and the "EAR" reconfiguration method are proposed for fault tolerance of mesh or torus-connected processor arrays, where the original idea of EAR is in EAM. The comparison among these and others is described in terms of the (run-time) array reliability, hardware overhead, and/or reconfiguration time. When a designer chooses one among fault tolerant methods, he should consider their features synthetically case by case, and we consider that the results given by this paper are useful for the choice.