It is well recognized that the electromagnetic interference due to indirect electrostatic discharge (ESD) is not always proportional to the ESD voltage and also that the lower voltage ESD sometimes causes the more serious failure to high-tech information equipment. In order to theoretically examine the peculiar phenomenon, we propose an analytical approach to model the indirect ESD effect. A source ESD model is given here using the spark resistance presented by Rompe and Weizel. Transient electromagnetic fields due to the ESD event are analyzed, which are compared with the experimental data carefully given by Wilson and Ma. A model experiment for indirect ESD is also conducted to confirm the validity of the ESD model presented here.

For analyzing the transient electromagnetic fields caused by electrostatic discharge (ESD), a new ESD model is presented here. Numerical calculation is also given to explain the distinctive phenomenon being well-recognized in the ESD event.