An Analytical Approach to Model Indirect Effect Caused by Electrostatic Discharge
Summary :
It is well recognized that the electromagnetic interference due to indirect electrostatic discharge (ESD) is not always proportional to the ESD voltage and also that the lower voltage ESD sometimes causes the more serious failure to high-tech information equipment. In order to theoretically examine the peculiar phenomenon, we propose an analytical approach to model the indirect ESD effect. A source ESD model is given here using the spark resistance presented by Rompe and Weizel. Transient electromagnetic fields due to the ESD event are analyzed, which are compared with the experimental data carefully given by Wilson and Ma. A model experiment for indirect ESD is also conducted to confirm the validity of the ESD model presented here.
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- IEICE TRANSACTIONS on Communications Vol.E79-B No.4 pp.483-489
- Publication Date
- 1996/04/25
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- Online ISSN
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- Type of Manuscript
- Special Section PAPER (Special Issue on Discharge and Electromagnetic Interference)
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Osamu FUJIWARA, "An Analytical Approach to Model Indirect Effect Caused by Electrostatic Discharge" in IEICE TRANSACTIONS on Communications,
vol. E79-B, no. 4, pp. 483-489, April 1996, doi: .
Abstract: It is well recognized that the electromagnetic interference due to indirect electrostatic discharge (ESD) is not always proportional to the ESD voltage and also that the lower voltage ESD sometimes causes the more serious failure to high-tech information equipment. In order to theoretically examine the peculiar phenomenon, we propose an analytical approach to model the indirect ESD effect. A source ESD model is given here using the spark resistance presented by Rompe and Weizel. Transient electromagnetic fields due to the ESD event are analyzed, which are compared with the experimental data carefully given by Wilson and Ma. A model experiment for indirect ESD is also conducted to confirm the validity of the ESD model presented here.
URL: https://global.ieice.org/en_transactions/communications/10.1587/e79-b_4_483/_p
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@ARTICLE{e79-b_4_483,
author={Osamu FUJIWARA, },
journal={IEICE TRANSACTIONS on Communications},
title={An Analytical Approach to Model Indirect Effect Caused by Electrostatic Discharge},
year={1996},
volume={E79-B},
number={4},
pages={483-489},
abstract={It is well recognized that the electromagnetic interference due to indirect electrostatic discharge (ESD) is not always proportional to the ESD voltage and also that the lower voltage ESD sometimes causes the more serious failure to high-tech information equipment. In order to theoretically examine the peculiar phenomenon, we propose an analytical approach to model the indirect ESD effect. A source ESD model is given here using the spark resistance presented by Rompe and Weizel. Transient electromagnetic fields due to the ESD event are analyzed, which are compared with the experimental data carefully given by Wilson and Ma. A model experiment for indirect ESD is also conducted to confirm the validity of the ESD model presented here.},
keywords={},
doi={},
ISSN={},
month={April},}
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TY - JOUR
TI - An Analytical Approach to Model Indirect Effect Caused by Electrostatic Discharge
T2 - IEICE TRANSACTIONS on Communications
SP - 483
EP - 489
AU - Osamu FUJIWARA
PY - 1996
DO -
JO - IEICE TRANSACTIONS on Communications
SN -
VL - E79-B
IS - 4
JA - IEICE TRANSACTIONS on Communications
Y1 - April 1996
AB - It is well recognized that the electromagnetic interference due to indirect electrostatic discharge (ESD) is not always proportional to the ESD voltage and also that the lower voltage ESD sometimes causes the more serious failure to high-tech information equipment. In order to theoretically examine the peculiar phenomenon, we propose an analytical approach to model the indirect ESD effect. A source ESD model is given here using the spark resistance presented by Rompe and Weizel. Transient electromagnetic fields due to the ESD event are analyzed, which are compared with the experimental data carefully given by Wilson and Ma. A model experiment for indirect ESD is also conducted to confirm the validity of the ESD model presented here.
ER -
English
